Category Archives: MEMS
November 18, 2009 – Scientists from IBM Research in Zurich, Switzerland, have created a diagnostic test using a silicon chip to more quickly diagnose diseases.
Their collaborative work with the U. Hospital of Base, published in the December issue of Lab on a Chip, uses capillary forces — the process whereby liquid rises in narrow tubes, or drawn into tiny openings — to analyze tiny samples of serum or blood to find disease markers, typically proteins detectable in human blood.
How it works: 1μl sample is pipetted onto a silicon-compound chip (1cm×5cm), and pushed by a 180μm capillary pump through a set of "micrometer-wide channels" onto a series of mesh structures, which prevent clogging and formation of air bubbles. It then passes through a region containing tiny amounts of a detection antibody (70 picoliters) with fluorescent tags, which recognize and attach to disease markers in the sample. Then, in a 30μm x 20μm "reaction chamber," the tagged disease markers are captured, and upon them shone a focused beam of red light so they can be viewed using a portable sensor device; the amount of light detected indicates the strength of the disease marker in the sample, which helps doctors determine the next course of action.
The flow takes about 15secs, "several times faster than traditional tests," IBM notes, and can be adjusted up to several minutes for reading more complex disease markers. The test could, for instance, be applied immediately after a myocardial infarction (heart attack) to help doctors more quickly take a course of action, and help predict patient survival rate.
![]() |
Layout of the 1cm×5cm microfluidic chip. The sample is pipetted onto the chip area and pushed through the mesh structure at a regular flow rate (a) by capillary forces created by a pump (d); then through serpentine tunnels (b) to prevent clogging and air bubble formation, and where antibodies have been deposited to recognize and attach to the sample; and then led into a "reaction chamber" (c) to be examined. |
From the paper abstract:
(Lab on a Chip also has posted a movie describing the process.)
The test "is portable, fast, and requires a very small volume of sample," according to Emmanuel Delamarche, scientist at IBM Research-Zurich. Its small size lends to various formfactors such as credit cards, pens, or "something similar to a pregnancy test," and with its speed "doctors […] can make informed and accurate decisions right at the time they need them most to save lives." Aside from disease diagnosis, potential applications include testing for chemical and bio hazards.
"This microfluidic chip is the next step in the evolution of point of care devices," stated Thierry Leclipteux, CEO/chief science officer of Coris BioConcept, a biotech company developing rapid tests for diagnosing enteric and respiratory pathogens.
November 16, 2009–Industry executives attending the annual MEMS Executive Congress last week in Sonoma, CA were buoyed by optimistic forecasts for MEMS devices, such as accelerometers and multi-axis gyros—increasingly used in mobile handsets and video games. Presentations and panel discussions included leading innovators in automotive, bio/medical, consumer electronics, mobile communications and energy.
Karen Lightman, managing director of MEMS Industry Group, the event’s host organization, said record-breaking attendance was, “In part it’s because we are experiencing a technology convergence in MEMS: sensors made for automobiles—extremely complex systems requiring the highest levels of safety and reliability—are being used for healthcare devices, such as heart monitors and 3D motion tracking."
Lightman added, "MEMS-based energy harvesters are being utilized in consumer and industrial systems, and they may one day be used in more energy-efficient, even all-electric, automobiles. And, with MEMS sensors opening up greater data collection, we will one day see things we haven’t even imagined in applications such as mobile phones.”
Highlights of the Congress included:
* Keynote by Dr. Shoichi Narahashi, executive research engineer, NTT DOCOMO Research Laboratories, on the cause-effect relationship between burgeoning multimedia services and requirements for future mobile terminals;
* Keynote by Dr. Mauro Ferrari on applications of nanotechnology in cancer detection and treatment, regenerative medicine, cardiovascular medicine and infectious diseases;
* An Automotive Panel debating the criticality of MEMS in controlling safety, efficiency and emissions—and predicting the eventual winner between hybrid-electric Vs all-electric vehicles;
* A Bio/medical Panel exhorting MEMS device makers to help them leverage sensors already proven for safety and reliability in automotive for a host of healthcare applications;
* An Energy Panel on the importance of MEMS in energy harvesting, especially in infrastructure installations in which cost reductions are paramount;
* A Consumer Electronics Panel citing the most important factor for MEMS in CE apps: it’s all about the cost.
* A Market Analyst Panel in which experts assessed the state of MEMS in 2009 and forecast emergent and resurgent growth areas in 2010 and beyond.
Next year’s MEMS Executive Congress will be held November 3-5, 2010 at the InterContinental Montelucia in Scottsdale, AZ. For more information, visit www.memscongress.com
by Debra Vogler, senior technical editor, Small Times
November 9, 2009 – HP recently announced an inertial sensing technology that enables the development of digital microelectromechanical systems (MEMS) accelerometers that are up to 1,000× more sensitive than high-volume products currently available. According to David Erickson, engineering manager in HP’s technology development organization, Imaging and Printing Group, the new sensors based on this technology can achieve noise density performance in the sub-100 nano-g/square root Hz range to enable dramatic improvements in data quality. The MEMS device can be customized with single or multiple axes per chip to meet individual system requirements; its dynamic range is >130dB with a bandwidth of 0-250Hz that is extendible to 10kHz.
HP views the current inertial sensing landscape as comprising consumer devices (i.e., low-performance/low-cost) and aircraft/navigation applications (i.e., high-performance, high-resolution, expensive, and power-hungry), according to Erickson. "What we are disclosing bridges the gap, bringing together the very high performance with the cost, size, and power you could expect from a MEMS device," he said.
One key to the inertial MEMS sensor technology is a design that uses a 3-wafer (single crystal silicon) construction as opposed to silicon-on-insulator (SOI) (see figure) — this enables temperature stability of the device, which plays directly into its low-noise sensitivity, Erickson told Small Times. Additionally, a large proof mass and the electrode design, which features constant gap sensing surface electrodes, are significant contributors to the performance. Specifically, device performance is enabled by increasing the area of the electrodes and decreasing the gap distance.
Most inertial sensors have a proof mass on springs that moves when the device moves (sensing the position of the mass with capacitive electrodes is the generally accepted approach), Erickson explained, but HP extended that principle by using a proof mass that is 1000× more massive than traditional MEMS devices. That translates into a three orders-of-magnitude improvement in noise floor performance, he said, and combined with HP’s electrode design, results in a device possessing unique features: "a much lower noise floor and a much broader dynamic range and much more thermally stable," he said. The proof mass is suspended by very high-aspect-ratio silicon springs that provide the required stiffness; very deep etches are required to make them. Though HP primarily uses standard etchers, the company has developed proprietary processes, Erickson noted.
Developing the manufacturing processes to release such a large proof mass was also a difficult challenge, according to Erickson: "It’s thick and big, and most MEMS processes don’t deal well with removing a lot of material." He said the innovation came about because the company was looking for ways to construct a micromover — i.e., a way to very precisely move a piece of silicon in a MEMS device. Because a MEMS accelerometer is akin to a motor in reverse, when the researchers built a motor with parallel electrodes to move the proof mass to a precise location, "that insight from the motor problem was applied to accelerometers […] We realized you could sense very precisely a proof mass motion with a similar electrode structure, and then we went to work on a large proof mass. So we came at it from a different angle than most sensor designers are using."
Other manufacturing processes also play a major role. "We’ve been working on manufacturing processes and process capabilities that allowed us to get to much smaller gaps," Erickson told Small Times. Smaller gaps mean larger capacitance, and therefore greater the signal-to-noise ratio (S:N). The way in which the electrodes are structured, the very small gaps and the parallelism of the electrodes — all contribute to an orders of magnitude change when the proof mass moves (i.e. the S:N ratio is higher).
The company believes that its test data suggest the new devices can enable new classes of applications — for example, bridge monitoring and seismic monitoring. "We’ve done quite a bit of work looking into bridge monitoring," said Erickson. "Sensors available today are insufficient to detect vibrations at frequencies that are needed for structural analysis."
"HP envisions that sensor networks utilizing HP’s new inertial sensing technology will create a new paradigm in bridge maintenance and safety," Grant Pease, business development manager, told Small Times. "The technology will provide higher resolution to measure vibration modes in a bridge, which in turn provides a better understanding of the structural health and usage. The inherent low power usage of the technology enables wireless operation over an extended period of time allowing for cost-effective implementation and use." (For additional discussion of bridge and infrastructure monitoring, see Small Times‘ interview with Michael O’Halloran of CH2M Hill: CH2M Hill, HP eye progress in infrastructure monitoring.)
The sensing technology is a key enabler of HP’s vision for a new information ecosystem, the Central Nervous System for the Earth (CeNSE). Integrating the devices within a complete system that encompasses numerous sensor types, networks, storage, computation, and software solutions enables a new level of awareness that facilitates communication between objects and people.
November 5, 2009 – Hewlett-Packard says it has developed a new inertial sensing technology that can be used for digital MEMS accelerometers that are up to 1000× more sensitive than other high-volume products, leading to more effective sensor networks for applications such as infrastructure/geophysical mapping and monitoring.
MEMS accelerometers are used to measure vibration, shock, or change in velocity. HP says its improved sensor technology (noise density down to a range of sub-100 nano-g/square root Hz, with single or multiple axes per chip), combined with its other offerings in data collection/evaluation/analysis, form the basis for a complete "Central Nervous System for the Earth," encompassing numerous sensor types, networks, storage, computation and software.
"With a trillion sensors embedded in the environment — all connected by computing systems, software and services — it will be possible to hear the heartbeat of the Earth, impacting human interaction with the globe as profoundly as the Internet has revolutionized communication," proclaimed Peter Hartwell, senior researcher, HP Labs, in a statement.
by Tony McKie, memsstar
Dry-etch process technology enables yield growth on advanced devices to create a fundamentally low cost base for MEMS development and production. Failure to address yield and production flexibility issues while expanding throughput to satisfy increasing MEMS demand will not allow MEMS industry participants to realize the full market potential of increasingly sophisticated MEMS devices.
Introduction: Opportunities and challenges
The MEMS industry has identified tremendous opportunities in applications such as mobile phones, game consoles, automobiles, and many other consumer products. Already, MEMS devices such as tiny surface-mount accelerometers and gyroscopes are enabling innovative features such as automatic screen-orientation detection for camera-phone handsets and motion-sensitive game controllers offering unprecedented interactivity. Other advances made possible by MEMS include ultra-miniature silicon microphones combining tiny dimensions with high dynamic performance for use in cell phones, headsets, and similar space-constrained applications.
To fulfill these major high-volume opportunities for MEMS manufacturers and realize the expected growth potential, device producers must be able to manufacture in high volume, achieve competitive prices compatible with consumer applications, and deliver more advanced and high-performing MEMS products in the future.
This combination of objectives presents a significant challenge. An intuitive response is to increase production — for example, by using batch-processing techniques — to deliver high volumes while at the same time realizing economies of scale. However, batch processing does not provide the ability to produce more advanced structures. In practice, it will also not deliver the anticipated improvements in throughput and cost, when all of its associated limitations are taken into account. Instead, MEMS manufacturers must seek improvements on a more fundamental level.
Prior experience
Some valuable pointers can be gained by considering the way semiconductor wafer-processing practices have advanced, since MEMS wafer processing has much in common with CMOS fabrication. Early semiconductor processes such as etching relied on wet chemistry, similar to first-generation MEMS release processing. However, wet chemistry has given way to dry processing, in the semiconductor industry, as shrinking process geometries have enabled progressively smaller circuit dimensions.
This transition is now evident in the MEMS industry as device manufacturers adopt a process such as vapor-phase release etching to achieve process enhancements that will enable smaller and more complex MEMS structures. Already, a number of process and equipment developers are offering dry etch to their customers, and several such advanced processes are now active worldwide.
![]() |
Figure 1. Poly-bridge with aluminum contacts/HF etch. |
Evolving MEMS processes
Release etching is the final stage of fabrication for surface micro-machined MEMS devices. This process releases the structure from the surrounding sacrificial material. As a replacement for release etching with acid, vapor-phase release processing, using anhydrous HF or XeF2 as the release agent, improves process control and increases selectivity. In addition, since the anhydrous release agent does not attack materials such as metals (Figure 1), vapor-phase release also provides greater freedom for device designers to build structures using materials that would not be compatible with a wet-chemical process.
The enhanced flexibility and control of vapor-phase release etching also allows fine tuning to deliver the best results for a given combination of process, device architecture, and structural and sacrificial materials, such as shown in Figure 2. For example, successful oxide release using anhydrous HF is achieved through accurate control of H2O vapor, as the catalyst for the reaction between the anhydrous HF and the oxide material, to maintain the desired etch rate. The memsstar vapor-phase release-etching processes permit the etch rate to be reduced or increased to achieve the best possible throughput, without compromising factors affecting yield, such as selectivity.
![]() |
Figure 2. RF-MEMS variable capacitor. Courtesy of NXP Semiconductor. |
Following the semiconductor industry’s lead in moving to vapor-phase processing delivers several advantages for MEMS manufacturers. These include helping to increase yields and improve device performance and reliability and by acting as an enabler for innovative new structures.
Volume-production techniques
As new markets and applications for MEMS emerge, and demand continues to grow for higher volumes and new types of products, device manufacturers can draw many more lessons from the semiconductor industry. Batch processing, for example, has recently been proposed to help speed up MEMS manufacturing and reduce unit costs. Some MEMS manufacturing equipment now on the market is capable of processing up to 25 wafers simultaneously.
However, although semiconductor manufacturing has successfully adopted vapor-phase processes, batch techniques have been tried and — in most cases — discarded. The majority of today’s semiconductor wafer-processing lines are set up to process only one wafer in a chamber at a time. Advantages include increased repeatability and faster cycle times for each process. MEMS process engineers can learn from this trend.
When a batch of several wafers is loaded into a process such as vapor-phase etching, the time to complete the process is actually significantly longer compared to single-wafer etching. Release etching for a batch of 25 MEMS wafers, for example, can require a total cycle time measured in hours. In contrast, the process can be completed within a few minutes when applied to a single wafer.
![]() |
MEMS wafer. |
In addition, batch processing is known to result in significant wafer-to-wafer variability, leading to relatively large numbers of rejected components. As MEMS device structures evolve toward finer dimensions, the tolerances associated with key parameters such as dimension control and film thickness are becoming significantly finer. Indeed, some of the latest MEMS designs now entering production cannot be produced satisfactorily using batch processing because wafer-to-wafer variability falls outside acceptable statistical limits. This is manifested as unpredictable yield, which prevents cost-effective manufacture.
In practice there are also loading effects associated with batch processing. This means that process performance will vary depending on whether all the wafer locations are filled, or whether a smaller number of wafers are presented for processing. If only 10 wafers are loaded into a process characterized for 25 units, the properties of the wafers emerging will differ from the expected results. Appreciable loading effects more or less force manufacturers to process only complete batches, which can slow down the production flow. Even then, the results can display noticeable variation, as already discussed. It is also extremely difficult to perform custom tasks on individual wafers, if required, in the context of a batch process.
The high wafer-to-wafer variability experienced with a batch process also effectively increases overheads such as materials consumption and the costs associated with testing. Rather than enabling manufacturers to benefit from economies of scale, therefore, batch processes having relatively poor process control incur extra costs to build and test large numbers of devices that will ultimately be scrapped.
Another factor to take into account when evaluating batch processing is the high cumulative value of the work in progress at any one time. This not only represents a significant investment in inventory, passing through the factory at a slow speed, but also exposes a relatively large number of wafers — each containing many individual components — to risk of damage. If a process is set up incorrectly, or is impaired by an event such as power outage or temporary loss of process control, a large number of wafers may become scrap simultaneously. Also, if a number of wafers are held up (e.g., waiting for other wafers to arrive to make up a full batch), these are at risk of damage or contamination that also may require one or more wafers to be scrapped.
Historically, batch processes have proved difficult and time consuming to qualify. There are many locations within the 3D space inside a multi-wafer processing chamber that must be characterized before the process can claim to be fully developed. Inaccuracy will compromise process performance, and hence will impair the yield from every batch. However, process developers cannot afford to spend excessive time characterizing their processes, and device manufacturers cannot afford to wait for a protracted period before a satisfactory process is ready to go live. In general, developing a satisfactory batch process demands considerable time and effort. Because a single wafer can be processed to a high standard, it does not necessarily follow that this can be scaled, reliably, to enable multiple wafers to be processed on a batch basis.
Single-wafer processing
Single-wafer processing overcomes the limitations of batch processing, and meets the current demands of MEMS device producers. Additionally, single-wafer processing not only enhances process control but also allows businesses to respond more quickly to market opportunities (Figure 3).
![]() |
Figure 3. An example of a successfully released MEMS structure. |
Relatively small numbers of devices can be produced cost effectively, and on a fast-turnaround basis, for research and development purposes, or for small production runs. At the current stage of development of MEMS technology, time to market is critical. Indeed, given the rapid pace of change, the high costs and long delays associated with setting up a batch process may exceed the total market opportunity of a given device.
Because single-wafer processing has been almost universally adopted within the semiconductor industry, complex and essential equipment such as wafer-handling stations are proven, reliable, and readily available. In contrast, batch handling equipment for MEMS is today highly bespoke. It is therefore relatively expensive and likely to remain so given the effectiveness of current single-wafer processes. In addition, the bespoke nature of the batch equipment effectively requires the MEMS manufacturer to enter into an equipment-development partnership with the vendor; a euphemism for accepting poor process performance for the foreseeable future.
In addition to the relatively high cost of the equipment, size can also be a disadvantage since batch equipment is inherently larger than an equivalent setup for single-wafer processing. This can be an important consideration for facilities in locations where real-estate prices are high.
The way forward
In the immediate term, as dry-etch technology continues to mature, process development for MEMS fabrication must focus on achieving further improvement in cost. Increasing yield is the best way to establish a fundamentally low cost base for MEMS fabrication, which is necessary for economical production at low unit cost in very high volumes. If this crucial groundwork is not done, batch processing will merely increase production of bad units, and therefore deliver only limited cost savings.
Recent market analysis from experts such as Yole Développement, suggests relatively flat demand for MEMS capacity in the coming months. This presents an opportunity for MEMS producers to focus on driving up yields during this period, and hence create the environment for low-cost, high-volume production in the longer term.
Conclusion
The performance of the semiconductor industry shows how maximizing yield holds the key to realizing full market potential. As semiconductor device designers pursued Moore’s Law to increase performance and integration, improvements in process capabilities have enabled a higher proportion of good die per wafer. This has made a valuable contribution to reducing the cost of each unit produced.
MEMS producers must make the most of opportunities to learn from the semiconductor industry’s prior experience. One of the most important lessons for today’s process innovators is to understand why, after alternatives have been tried and discarded, single-wafer processing remains the technique of choice for high-throughput, high-yield fabrication.
Acknowledgment
The company name memsstar is a registered trademark.
Biography
Tony McKie received his Honours degree in physics from Paisley Technology College in 1987 and is general manager and co-founder at memsstar, Starlaw Park, Starlaw Road, Livingston, West Lothian, Scotland EH54 8SF; ph.: +44 1506 409163; e-mail [email protected].
November 2, 2009 – Integrated Sensing Systems Inc. (ISSYS ) is expanding its production capacity in the Ann Arbor, MI region, possibly including moving to a new facility and adding 40-50 workers over the next two years, according to a local report. The proposal comes as a result of a new $18.5M financing, led by Swiss sensor supplier Endress+Hauser Flowtec AG and New York-based manufacturer Greatbatch Inc.
The company plans to invest primarily in manufacturing capacity and product development, according to founder/CEO Nader Najafi, quoted by the paper; this would include either expanding its current facility in Ypsilati Township or possibly uprooting to bigger facilities, perhaps one in Ann Arbor’s research park formerly occupied by Tecumseh. Either way, "we need more capacity," Najafi told the paper. "We’re definitely going to use the capital within the next two, two-and-a-half years," he said, adding that the company expects to add 70-80 workers by 2012.
October 29, 2009 – Students from Japan’s Kyoto University have created a system that mimics the wah-wah tones of the armchair rock star’s shredding weapon of choice: the air guitar.
The system — which uses sensors to create guitar sounds based on moving hands as if playing the instrument — took top honors at a domestic MEMS competition ahead of the IEEE-NEMS event in China in January, where it will compete against teams from the US, China, Germany, Singapore, Taiwan, and Hong Kong, notes the Nikkei daily.
Two other teams from Japan are going as well — another Kyoto group that built a toy displaying different LED light patterns depending on its rotational speed, and a group from Shinshu U. with a device that lights up when sensing fluctuations in sounds and music, the paper notes.
October 26, 2009 – Microstaq, a developer of silicon MEMS-based fluid control technology, has qualified its Ventilum MEMS-based chip at Chinese foundry Semiconductor Manufacturing International Corp (SMIC).
Microstaq says its "silicon expansion valve" (SEV) using the Ventilum chip tech allows for fluid movement measured in liters (vs. nanoliters as with most MEMS devices), and uses less energy than traditional valves. Combined with sensing and controls it can reduce energy consumption in air conditioning systems by up to 25%. "We have received die and run internal testing against our performance specification," noted Mark Luckevich, VP of engineering, in a statement.
For SMIC, the qualification further supports its MEMS foundry offerings, which it launched in 2Q08 and now runs the gamut from optical MEMS to microphones, accelerometers, RF MEMS, and microdisplays. "We are now working with technical partners on monolithic CMOS-MEMS integration, as well as wafer-level packaging," stated Daniel Fu, SMIC associate VP of MEMS technology development, adding that the foundry also is coordinating with "several China universities and institutes to develop MEMS platform process."
October 16, 2009 – Researchers led by a team at Arizona State U. have created a single-molecule diode that could pave the way to creation of new chemical sensors, and ultimately capabilities that complement and extend those in silicon-based electronic devices.
Diodes enable electrical current to flow in one direction around a circuit but not another — they’re critical and ubiquitous components in various electronics applications including power conversion, logic gates, photodetectors, and LEDs. A molecule with this capability needs to be asymmetric, with its ends forming covalent bonds with the anode (negative) and cathode (positive) contacts.
Work on using molecule-based components has been ongoing for decades, but most of it has focused on groups of molecules (e.g., molecular thin films). Challenges include bridging a single molecule to at least two electrodes, and in proper orientation of the molecule in the device, the researchers note.
The group, led by ASU’s N.J. Tao with participation from scientists at the U. of Chicago and U. of South Florida, came up with a technique relying on AC modulation, applying "a little periodically varying mechanical perturbation to the molecule" to tell if there’s a molecule bridged across two electrodes. They used conjugated molecules incorporating alternating single and multiple bonds, which display large electrical conductivity and have asymmetrical ends that can spontaneously form the needed covalent bonds with metal electrodes, they note.
![]() |
Schematic for molecular diode. The symmetric molecule (top) allows for two-way current. The asymmetrical molecule (bottom) permits current in one direction only and acts as a single-molecule diode. (Source: ASU Biodesign Institute) |
From the abstract of their paper, published in Nature Chemistry:
The diblock molecule exhibits pronounced rectification behaviour compared with its homologous symmetric block, with current flowing from the dipyrimidinyl to the diphenyl moieties. This behaviour is interpreted in terms of localization of the wave function of the hole ground state at one end of the diblock under the applied field. At large forward current, the molecular diode becomes unstable and quantum point contacts between the electrodes form.
Application for a single-molecule diode includes new chemical sensors; eventually they could offer electronic, mechanical, optical, and other properties that complement silicon-based technologies, Tao noted.