Device Architecture

DEVICE ARCHITECTURE ARTICLES



AMAT-conductor-etch-system-debut

11/29/2010 

Applied Materials (AMAT) speaks about its new conductor etch system -- the Centris AdvantEdge Mesa Etch -- released at SEMICON Japan this week. The company sees the gap in the lithography roadmap is an etch opportunity. Thorsten Lill, VP Etch Business Group, at Applied, told ElectroIQ that new steps in advanced transistors, double-patterning, and advanced packaging are driving growth in the conductor etch market (~$1.6B market in 2010).

UCSD-engineers-develop-pulse-compressor-on-silicon

11/29/2010 

University of California, San Diego (UC San Diego) engineers developed the first ultra compact, low power pulse compressor on a silicon chip to be described in the scientific literature.

Gate-first says Globalfoundries

11/29/2010 

Globalfoundries gate-first approach to HK+MG processingNick Kepler, Globalfoundries presenter at the IEEE Bay Area Nanotechnology Council’s Half-day Symposium, described the company’s rationale for selecting the gate-first approach to HK+MG processing. Kepler also discusses EUV lithography (EUVL) use at 20nm.

TSMC-work-on-Si-interposers-TSV-die-stacking

11/26/2010 

TSMC packaging interviewDi Ma spoke with Debra Vogler, senior technical editor, ElectroIQ, about TSMC's work with silicon interposers, die stacking with through-silicon vias (TSV), and gate-last transistor fab.

TSMC chooses gate-last on 28nm CMOS

11/26/2010 

Transistor architecture beyond HK+MG. SOURCE: TSMCFive factors drove TSMC's decision to select the gate-last approach: speed, power, reliability, manufacturability, and scalability. Di Ma, VP, field technical support at TSMC, speaks with ElectroIQ about TSMC’s efforts with respect to transistor architecture beyond HK+MG.

FDSOI-to-TSV-IEDM-preview-CEA-Leti research

11/24/2010 

CEA-Leti will present 10 papers, including two invited papers, at the IEDM/IEEE 2010 International Electron Devices Meeting December 6-8, in San Francisco, CA. The papers will cover More than Moore, FDSOI, memory (phase-change and charge-trapping), silicon nanowires, TSVs, high-k dielectrics, and more.

University of Tokyo first to demo III-V self-aligned source/drain

11/23/2010 

At the upcoming IEDM, researchers from Japan will show promising results of fabricating a Ni-InGaAs alloy to yield the first self-aligned source/drain III-V semiconductor MOSFETs.

FDSOI-to-TSV-IEDM-preview-CEA-Leti research

11/23/2010 

CEA-Leti will present 10 papers, including two invited papers, at the IEDM/IEEE 2010 International Electron Devices Meeting December 6-8, in San Francisco, CA. The papers will cover More than Moore, FDSOI, memory (phase-change and charge-trapping), silicon nanowires, TSVs, high-k dielectrics, and more.

IBM, Macronix identify phase-change memory failure mode: IEDM Preview

11/19/2010 

At the upcoming International Electron Devices Meeting (IEDM), researchers from IBM and Macronix will report on their findings of electromigration-induced failures when phase-change memory (PCM) cells are reverse-stressed.

15nm-nodes-Applied-Materials development work

11/19/2010 

15nm Applied Materials workChristopher Bencher, member of the technical staff at Applied Materials, gave a presentation at the IEEE Bay Area Nanotechnology Council’s Half-day Symposium on process and integration-based scaling for 15nm nodes. In an interview with Debra Vogler, senior technical editor, Bencher discussed the company’s development work at 15nm.

Record-photodiode-quantum-efficiency-IEDM-preview

11/16/2010 

QE photodiode recordLaura Peters, contributing editor, covers a team led by the National Nano Device Laboratories (Hsinchu, Taiwan), which has achieved a record external quantum efficiency (QE) of >80% for photodiodes in the visible regime. This QE was achieved by harnessing an LSPR effect, which enhances transmission efficiency in a conventional silicon photodiode. The team will present their results at IEDM.

optimized-cylinder-materials-for-hydrogen-bromide-for-silicon-etch

11/15/2010 

Minimize silicon trench etch process variations with optimized cylinder materials for hydrogen bromide deliveryHBr with consistently low water vapor levels is critical to prevent delivery system corrosion and device performance issues during trench etch for CMOS fabrication. Jianlong Yao et al, Matheson, present the effect of cylinder material on delivered moisture concentration in gas phase HBr. Polished AISI Cr-Mo steel, Nickel-lined AISI Cr-Mo steel, and 316L stainless steel cylinders show markedly different results.

Samsung-storms-DRAM-memory-sector-in-Q3, eyes market control in 2011

11/15/2010 

dram suppliersSamsung Electronics Co. Ltd. became the only Top 5 DRAM supplier to achieve revenue growth in Q3 2010, solidifying its domination of the market, according to the market research firm iSuppli Corp. Micron continued to stumble, but will it fall in 2011?

The end of graphics memory price margins? iSuppli sees GPU falling to CPU

11/11/2010 

CPU integration is pushing graphics off dedicated memory, causing graphics-centric memory to lose share of the DRAM market over the next 5 years. The flattening of the graphics memory segment represents a major change, considering its attractive margins, fierce rivals and major players that graphics memory attracted.

InvenSense-integrates-3-axis-gyroscope-3-axis-accelerometer-on-single-silicon-die

11/10/2010 

InvenSense released its MPU-6000 product family. The MPU-6000 MEMS motion sensing technology integrates a 3-axis gyroscope and a 3-axis accelerometer on the same silicon die together with an onboard Digital Motion Processor (DMP) capable of processing complex 9-axis sensor fusion algorithms.

SIA ups outlook, cracking $300B in 2010

11/09/2010 

The SIA has bumped up its outlook for 2010 semiconductor sales to 32.8% growth to $300.5B, aligning it more with industry peers -- but above the current pace indicated by its own monthly data.

SEMATECH-III-V-MOSFET-FinFET-RAM-IEDM-preview

11/09/2010 

Revealing research breakthroughs, engineers from SEMATECH’s Front End Processes (FEP) program will present technical papers at the IEEE International Electron Devices Meeting (IEDM), December 6-8 in San Francisco.

Smartphone-IC-market-surge-in-2010-NAND-DRAM consumption rising

11/08/2010 

The worldwide smartphone IC market forecast is expected to register a strong 20% 2010-2014 CAGR, according to IC Insights' new 2011 edition of its IC Market Drivers report (to be released in November).

Intermolecular-Elpida-extend-R-D-collab-for-advanced-DRAM-technology

11/04/2010 

Intermolecular expanded its collaborative development program with Elpida Memory. This new multi-year agreement focuses on research, development, manufacturing process transfer and high-volume yield-ramp support for multiple generations of DRAM technology.

IEDM Preview: When do TSV stresses affect device operation?

11/01/2010 

At this year's IEDM, IMEC researchers will discuss the impact of mechanical stresses on device performance for through-silicon vias (single and arrays), showing how complex interaction of stress components hampers design rules and layout.




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

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