Attendees choose 'best-in-show' products
09/01/2004
Solid State Technology invited Semicon West attendees to vote on the best products they saw at the trade show, which took place from July 12–14 at San Francisco's Moscone Convention Center and July 14–16 at the San Jose Convention Center.
There are three categories of awards, which were given for both the Wafer Processing (San Francisco) Products and the Final Manufacturing (San Jose) Products.
Ballots were available in the Attendees' Choice Awards Directory. Companies with a product listing in the directory appeared on the ballot; there was also a space included for write-in votes. See www.solid-state.com for more details.
More photos from the Semicon West show.
Wafer Processing Winners Semicon West, San Francisco
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Best solution to a problem: Lighthouse Worldwide Solutions' HH2016 particle counter is claimed to be the first and only handheld counter with 0.2µm sensitivity. The counter can be used as a mobile particle monitor or as part of a larger facility-monitoring system. Lighthouse Worldwide Solutions, San Jose, CA; ph 408/228-9200, [email protected], www.golighthouse.com.
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Most innovative: Applied Materials Inc. PDC Group's SEMVision G2 FIB defect-analysis system integrates SEM capability with automated focused ion-beam cross-sectioning and EDX analysis technology for high-speed, high-resolution defect review and analysis in one in-line production tool. Applied Materials Inc., Santa Clara. CA; ph 408/563-0647, e-mail [email protected], www.appliedmaterials.com.
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Best cost-of-ownership: KLA-Tencor Optical Metrology Div.'s SpectraCD 100 uses broadband spectroscopic ellipsometry with reflective optics across a continuous wavelength spectrum from 190–800nm to detect process issues that require extreme sensitivity. KLA-Tencor Corp., San Jose, CA; ph 408/875-4200, fax 408/875-4144, e-mail [email protected], www.kla-tencor.com.
Final Manufacturing Winners, Semicon West, San Jose
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Best solution to a problem and Most innovative product: Multiprobe's Multiscan Atomic Force Probe (AFP) quickly and repeatedly measures electrical performance characteristics of 90nm and 65nm transistors. Multiple specialized atomic-force microscope heads, controlled by patent-pending Multiscan software, locate a failing transistor and contact closely spaced terminals. Multiprobe, Santa Barbara, CA; ph 805/560-0404, fax 805/560-0414, e-mail [email protected], www.multiprobe.com.
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Best cost-of-ownership: Feinfocus' WBI-FOX inspection system meets regulator automated handling standards for 200mm/300mm wafer capability. It has a customized, automated wafer-handling system to prevent human interface with the wafers and flexible inspection processes (recipes) that adjust to specific wafer characteristics. Feinfocus, Stamford, CT; ph 978/794-5441, fax 978/688-8418, e-mail [email protected], www.feinfocus.com.