Cryogenic probing stations

11/01/1998

Cryogenic probing stations

The Model BCT series cryogenic probing system operates without liquid helium or nitrogen and can measure semiconductor parameters and microwave characteristics in the 4K to 150?C (max) wide range. The high insulation stage, low-noise probe head, cable, connector, complete shield chamber, and clean vacuum combine to decrease measurement typical noise level to <1 pA and to measure microwave characteristics up to 60 GHz. Model CCT series is a fully automatic cryogenic probing station. It includes a probe card, wafer-transfer system, and wafer-scanning system, and it can be used for reliability screening for CMOS bare chip devices (KGD) on wafers. Nagase Co. Ltd., Tokyo, Japan; ph 3/3665-3846, fax 3/3665-3956.For FREE info circle 480