Data analysis software for parametric test

10/01/1998

Data analysis software for parametric test

KTE WaferMap software is used for process monitoring and device characterization. It offers comprehensive wafer mapping, statistical analysis, and pass/fail determination of real-time or stored test results. Separate wafer-centric GUIs are tailored for production operators and development engineers. The live pass/fail screen gives the parametric test operator a comprehensive overview of the testing process. As each site test is completed, the on-screen wafer map is updated in either red (site failure) or green (site pass). As each wafer test is completed, the wafer cassette graphic is similarly updated to indicate whether the wafer has passed or failed. Keithley Instruments Inc., Cleveland, OH; ph 800/552-1115 or 440/248-0400, fax 440/248-6168, e-mail [email protected].