VLSI test system

09/01/1998

VLSI test system

The VS 2000e is an optional configuration of the high-pin-count Valstar Series VS 2000 test system. The 2000e matches all the capabilities of the 2000 for testing the complex logic, embedded memory, and embedded analog found in today`s high-pin-count VLSI chips. Specific applications include microprocessors, controllers, advanced chipsets, ASICs, and FPGAs. Low-power, stabilized CMOS technology packs the full 1024 I/O pins and data rates of 200 MHz into <3 m2 and consumes <16 kW of power. Combining 3-Gbit scan memory and a high-speed Iddq measurement feature, the 2000e allows multisite testing of up to 16 devices in parallel. Credence Systems Corp., Fremont, CA; ph 510/623-4774, fax 510/623-2524, e-mail connie_graybeal@ credence.com.