Tip evaluation system

09/01/1998

Tip evaluation system

Available for all NanoScope Dimension and MultiMode scanning probe/atomic force microscopes, this tip evaluation system determines whether the tip meets a selected sharpness criterion or should be replaced. The package includes the proprietary tip evaluation software, as well as a roughness standard that is scanned as part of the evaluation. Based on the analysis, the software presents a worst-case tip sharpness in numerical and graphical form, including displaying an image of the tip itself. Digital Instruments, Santa Barbara, CA; ph 805/967-1400, fax 805/967-7717, e-mail [email protected].