Defect modeling software

08/01/1998

Defect modeling software

Electron Flight Simulator software, version 3.1, improves the accuracy and quality of defect analysis in the SEM and DRT. It shows how the electron beam interacts with defects in the SEM/DRT and helps predict the resulting x-ray signal, and shows the user how to run the SEM/DRT to get the most accurate chemical analysis of particles, thin films, and any type of defect. The software can model particles and defects of any chemistry, handle multilayer samples, and look at cross-sections. Small World, Great Falls, VA; ph 703/849-1492, e-mail [email protected].