Probe card testing

11/01/1996

Probe card testing

PrecisionPoint probe card instruments have been enhanced with the addition of the VX probe force measurement tool, the Vision integrated checkplate, and the API beveled window checkplates. The VX is used to verify the true gram force of each probe in a probe card. Included with the tool is Wire Checker, a specialized utility that reports mis-wired cards before they damage a wafer or shut down the test process. With the Vision integrated checkplate, the probe cleaning and contact resistance measurement process is reduced to a simple mouse command, eliminating process steps and improving throughput. The API beveled window checkplates eliminate the possibility that small-diameter probe tips will be damaged by surface features of the checkplate. Applied Precision Inc., Issaquah, WA; ph 206/557-1000, fax 206/557-1055