Scanning probe microscope

12/01/1997

Scanning probe microscope

The Dimension 3000 SPM has been enhanced to provide easier operation and CE certification. The new Dimension 3100 includes an x-y stage that provides better bidirectional repeatability and speed, as well as improved trackball response. The illuminator is now computer-controlled for easier focusing and zooming for optical location of features for high-resolution scanning. Video image capture capability is also included, as well as more efficient packaging for a reduced footprint. Digital Instruments, Santa Barbara, CA; ph 805/967-1400, fax 805/967-7717, e-mail [email protected].