Scanning probe microscope

11/01/1997

Scanning probe microscope

The Dimension 3000 scanning probe microscope has been enhanced to provide easier operation, improved functionality, and CE certification. The Dimension 3100 includes all the features of its predecessor, plus an x-y stage that provides better bidirectional repeatability and speed, as well as improved trackball response. The illuminator is computer-controlled for easier focusing and zooming for optical location of features for high-resolution scanning. Video image capture capability is included, as well as more efficient packaging for easier installation and reduced overall footprint. Digital Instruments, Santa Barbara, CA; ph 805/967-1400, fax 805/967-7717, e-mail [email protected].