Water probing station

11/01/1997

Wafer probing station

The Horizon 4090? wafer prober, offered with integrated mini-environment and SMIF, supports fab environments of both parametric test (or in-line electrical test) and sort floor areas. In addition, it supports the Class 1 test and high load at sort requirements of =0.25-?m design rules and emerging flip-chip and controlled-collapse chip connection (C4) technologies. The 4090? is designed to perform high-force probing (over 70 kg), accommodating the high pin counts and loading by all advanced probe card technologies - Cobra, Vertical, and Membrane - in an ultraclean environment. Electroglas Inc., Santa Clara, CA; ph 408/727-6500, fax 408/982-8025, www.electroglas.com.