Analysis of multiple maps

09/01/1997

Analysis of multiple maps

DefectAnalyzer provides a comprehensive analysis of multiple wafer maps. These composite maps of one to 200 wafer overlays can be generated from DefectAnalyzer`s wafer gallery, allowing users to display wafer map color-coded levels, classification codes, or defect size. It provides defect density, chip quadrant, and radial distributions. Galleries of wafers and images are based on users` selection criteria. A powerful charting package is included for Pareto, Trend, and box charts. DefectAnalyzer generates defect maps for adders, common, previous level, cluster, repeaters, and random defects. Viewing single wafer levels, composites, or multiple wafer composites and other distributions in 3-D multiple color representation enhances the user`s ability to diagnose problem areas quickly. LPA Software Inc., South Burlington, VT; ph 800/572-7731, fax 802/862-3856, e-mail [email protected].