Scanning Electron microscopes

08/01/1997

Scanning electron microscopes

The S-4700 FE SEM and the S-3500N Variable Pressure SEM incorporate high-density frame memories with maximum pixel counts of 2560 ? 1920. Both instruments include Rapid Image Shift Movement capability for fast, accurate navigation around the specimen. The S-4700`s objective lens contributes to superior resolution (25? at 1 kV), which is maintained

at longer working distances, as well as high tilt angles on large samples. The S-3500N offers high-resolution imaging whether operated in conventional high-vacuum mode or variable pressure mode. Hitachi Scientific Instruments, Mountain View, CA; ph 800/227-8877, e-mail [email protected], www.nissei.com.