RTP System

08/01/1997

Test station

The eXtended Test Station (XTS) tests devices of up to 576 I/O pins at speeds up to 200 MHz. Testers in the XTS series support mix-and-match of parallel, scan, and memory test modules within a single system. The XTS also provides DC Parametric measurements and is expandable for mixed-signal and MCM testing. Additional features of the XTS FT include odd and fractional clocks up to 400 MHz. Flex Time architecture provides timing-on-the-fly control of the delay, period, and individual sub-cycles. Integrated Measurement Systems Inc., Beaverton, OR; ph 503/626-5387, fax 503/644-6969, e-mail [email protected].