analytic crystallography

07/01/1997

Analytical crystallography service

This service is based on Orientation Imaging Microscopy (OIM), and provides microtexture mapping, grain boundary characterization, and phase identification of polycrystalline materials. Available on both scanning (SEM) and transmission electron microscopes (TEM), the OIM service facilitates the characterization of microstructures down to nanocrystalline levels. It focuses on the crystallographic aspects of interconnect reliability (electromigration, hillocks, stress voiding); thin films and metallization layers (grain size, local texture mapping); grain growth and recrystallization; microtexture and grain boundary studies; phase identification of particles; and mapping of multiphase materials. Grain sizes down to about 0.1 ?m are analyzed using a SEM, while nanocrystals are analyzed on a TEM. TexSEM Laboratories Inc., Provo, UT; ph 801/344-8990, fax 801/344-8997 or Materials Analysis Group, Sunnyvale, CA; ph 408/991-4868, fax 408/991-4801.