Automated AFM

07/01/1997

Automated AFM

Designed as an on-line tool for the fab, The Dimension 9000 automated atomic force microscope (AFM) includes automatic probe characterization, replacement, and alignment, removing the need for operator intervention. The probe characterization software continuously evaluates the condition of the probe, using the sample under study. When the software determines that the probe is worn or broken, a new probe is loaded automatically from a cassette holding 24 tips. Once mounted, the probe is automatically aligned with the AFM laser beam and tuned for operation. No user adjustments are required during the cantilever exchange process. The system also features active vibration isolation and SECS II interface, and is SMIF compatible. Digital Instruments, Santa Barbara, CA; ph 805/967-1400, fax 805/967-7717, URL http://www.di.com.