Docking emission microscope

06/01/1997

Docking emission microscope

Functional failures can now be found in devices with speeds of 150-300 MHz, from the backside of the device. DEMI is a docking emission microscope that uses test vectors from ATE equipment to light up transient functional defects. It docks the ATE test head directly to the emission microscope and has no upper device speed limit. Imaging is actually triggered when the test vectors activate the failure. Hypervision Inc., Fremont, CA; ph 510/651-7768, fax 510/651-1415, e-mail [email protected].