Scanning probe microscope for UHV

03/01/1997

Scanning probe microscope for UHV

AutoProbe VP2 is a scanning probe microscope (SPM) designed for atomic-scale surface analysis in ultrahigh vacuum (UHV). The instrument combines high-temperature imaging with 3-D probe positioning, advanced spectroscopy functions, and self-sensing atomic force microscopy (AFM) probes, and is available in three configurations - standard, extended y-translation, and high temperature. The VP2 offers high-temperature operation in both scanning tunnel microscopy (STM) and AFM, with STM images up to 600?C and AFM images up to 300?C, and it provides both direct and indirect heating capabilities up to 1200?C for sample annealing. Variable temperature studies in AFM and STM can yield new information on such phenomena as phase transitions between surface melting and crystallization, step formation, defect growth, and surface re-crystallization. Direct applications include the fundamental physics of surface absorbates, novel semiconductor compounds, and atomistic studies of chemical interaction. Park Scientific Instruments, Sunnyvale, CA; ph 800/776-1602, fax 408/747-1601, e-mail [email protected], URL http://www.park.com.