Self-test Technology Tackles Mixed-signal Devices

01/01/2000

Fremont, Calif. - An expansion of built-off/self-test (BOST) technology by Credence Systems Corp. is set to bring the approach into the mixed-signal testing arena. The Phase-Lock-Loop BOST (PLLBOST) leverages voltage-controlled oscillator built-in self-test (BIST), or VCOBIST (Fluence Technology), engineering into the company`s suite of digital mixed-signal test platforms to provide a robust test coverage solution for volume production testing. The method measures frequency and jitter used to test PLL clock generation blocks on complex devices, such as graphics controllers, without using specialized instrumentation. The BIST circuit is implemented into a field programmable gate array that is placed off the chip on the test fixture, which is said to promote test reuse and to enable designers to wrap test functions around design intellectual property blocks. Contact Connie Graybeal at (510) 623-4774.