As the semiconductor industry has advanced to the beat of Moore’s Law, executives have repeatedly expressed concern about the rising cost of lithography.
Dedicated molecular contamination analyzers based on ion mobility spectroscopy (IMS) can detect NH3 and SO2 contamination events in real time as well as measure ppt-level trends through long-term averaging.
We place cookies on your device to give you the best user experience. By using our websites, you agree to placement of these cookies and to our Privacy Policy. Please click here to accept.