Issue



Table of Contents

Solid State Technology

Year 2007
Issue 12

DEPARTMENTS

Editorial


Will 3D keep the chip industry rolling?

There may be trouble ahead for the conventional shrink approach to Moore’s Law.


World News.html


World News


Technology News.html


Technology news


Mems


Simulation software enables DFM for MEMS

Mask aligners are usually used as proximity printing tools where the mask is printed on the wafers using a “shadowing” technique.


Emerging Technology


Industry confronts porous dielectrics...again

The semiconductor industry’s last attempt to integrate porous dielectrics ended in a retreat to simpler solutions.


Industry Forum


Rising lithography costs: Where’s the crisis?

As the semiconductor industry has advanced to the beat of Moore’s Law, executives have repeatedly expressed concern about the rising cost of lithography.


FEATURES

Metrology


Characterization and in-line monitoring of low-k porogen formation

The competitive requirement for increased device performance has compelled the IC industry to introduce lower dielectric constant (k) materials.


Cu Low K


Manufacturing integration considerations of through-silicon via etching

Through-silicon vias (TSV) will provide interconnect capability among multiple die in advanced three-dimensional integrated circuit (3D IC) designs.


Mems


DRIE from MEMS to wafer-level packaging

Deep reactive ion etching (DRIE) has enabled the manufacturing of many different types of MEMS devices.


Lithography


Optimized molecular contamination monitoring for lithography

Dedicated molecular contamination analyzers based on ion mobility spectroscopy (IMS) can detect NH3 and SO2 contamination events in real time as well as measure ppt-level trends through long-term averaging.


PRODUCTS

Featured Products.html


Featured Products


Product News.html


Product News