Issue



Table of Contents

Solid State Technology

Year 2005
Issue 2

DEPARTMENTS

Editorial


A new event for a ‘new’ industry

There’s lots of discussion these days about how technological complexity and global market forces have combined to apply continuous and heavy pressure on the profit margins of semiconductor manufacturers.


World News


World News


Tech News


Asian technologists’ 45nm outlook


Feol


Thermal budget reduction drives RTP beyond the 45nm node

Limits on thermal exposure are being driven by advanced node requirements and depend on the device’s physical state at any given point, as well as the kinetics of the undesired phenomena that may arise from heat treatment


Compound Semiconductors


III-nitride epitaxial growth with real-time access to wafer temp, ternary composition

In all epitaxial growth processes of III-Vs and related materials (MOCVD, MBE, CVD), an accurate control of the true wafer temperature is essential, primarily because the composition of key materials depends on it to a very large extent.


Product News


Product News


Perspectives


‘Design for manufacturing’ spreads

Solid State Technology asked design automation managers how DFM software is shifting the responsibilities for wafer yields.


FEATURES

Cover Article


LITHOGRAPHY SERIES, PART 1: Low-k1 imaging for contacts and lines using immersion ArF

Immersion lithography has the potential to extend current 193nm argon-fluoride technology to the 45nm process node by effectively reducing the wavelength of exposure light for improved depth-of-focus and enabling lens designs with numerical apertures >1.0.


Deposition


Crucial applications addressed via fundamental ALD advances

The need for ultrathin high-k dielectric DRAM capacitors used in memory applications below 100nm, and for ultrathin high-k gate-dielectric materials in transistors at the 65nm node and below, presents challenges for improving ALD productivity.


Gas Handling


Avoiding fire and explosion risks with proper H2 exhaust management

Hydrogen is used extensively in wafer fabrication processes for epitaxial deposition in silicon and compound semiconductors.


Mems


Selectivity/etch rate trade-offs in deep and high A/R oxide etching

Selective etching of silicon oxides relative to silicon or photoresist is achieved when the concentrations of CF+ and CF2+ ions in the plasma are optimized relative to CF3+.


ASIA-PACIFIC

China


China launches 300mm manufacturing

It was not long ago that China’s leading-edge integrated circuit (IC) manufacturing capability lagged behind the rest of the world by two or more generations.


Korea


The launch of Korea’s ‘new’ $1 billion chip company

October marked the official launch of MagnaChip Semiconductor Ltd., South Korea’s $1 billion semiconductor spinoff company and a milestone for the Korean chip industry.