Materials and Equipment

MATERIALS AND EQUIPMENT ARTICLES



Metrology merger: MicroSense acquires SigmaTech

06/13/2012 

MicroSense, maker of high-resolution capacitive position sensors, metrology modules, and high-sensitivity magnetic metrology tools, acquired SigmaTech, developer of high-sensitivity metrology tools for LED, MEMS, and semiconductor manufacturing.

Kulicke & Soffa (KLIC) appoints treasurer with Asia experience

06/12/2012 

Semiconductor assembly tool maker Kulicke & Soffa (KLIC) named Pui Yee Lee as VP and corporate treasurer, reporting to SVP and CFO Jonathan Chou.

Advantest tackles 3D package test with new product line

06/08/2012 

Advantest is developing a line of fully automated and integrated test and handling solutions for TSV-based 2.5D and 3D packages. The concept model test cell, DIMENSION, integrates a high parallel test cluster along with singulated die and 3D die stack automated handling capabilities.

Multitest test loader/unloader offered in various configurations

06/08/2012 

Multitest has made its InCarrier Loader/Unloader available in a variety of configurations, e.g. for loading from tube, bowl, tray and for unloading into tube, bulk or metal mag in any combination.

FormFactor probe card tests SoCs

06/07/2012 

FormFactor Inc. (NASDAQ: FORM) introduced TrueScale Matrix probe cards for 200mm and 300mm Full Wafer Contact system-on-chip (SoC) test applications.

@ The ConFab: Supply chain or supply web for 3D packaging?

06/06/2012 

With many advanced packaging processes taking place on the semiconductor wafer, the traditional supply chain of front-end fab at the foundry and back-end fab at the packaging and test house is falling apart. The ConFab session,

3D and 2.5D semiconductor packaging technologies @ The ConFab

06/06/2012 

As packaging has played a larger and larger role in chip performance, form factor, and capabilities, The ConFab has increased its focus on back-end processes. Cue

Flash memory maker orders additional Aehr full-wafer test tool

06/05/2012 

Aehr Test Systems (Nasdaq:AEHR) will install an additional FOX-1 full-wafer test system at a leading flash memory manufacturer.

Conference Report: International Interconnect Technology Conference, IITC

06/05/2012 

The 15th IITC (International Interconnect Technology Conference) opened Monday, June 4 at the Doubletree Hotel in San Jose, CA. Recurring themes this year were variations on 3D and TSV, novel systems and packaging, and back end memory. Mike Fury reports.

APDN extends DNA products to microelectronics counterfeit prevention with S3IP

06/04/2012 

The New York State Center of Excellence in Small Scale Systems Integration and Packaging at Binghamton University (S3IP), and Applied DNA Sciences will develop new ways to embed and authenticate DNA on various substrates. This may involve marking semiconductor packaging, and exploring rapid-reading technologies to screen chips.

ECTC: Focus on 3D integration and TSVs

06/01/2012 

A main focus of this year’s Electronic Components and Technology Conference (ECTC), held this week in San Diego, is 3D integration and through silicon vias (TSVs).

New Japan Radio implements Cu wire bonding for power semiconductors

05/30/2012 

New Japan Radio Co. Ltd. adopted Tanaka Denshi Kogyo KK

Semiconductor packaging house orders 14 Rudolph Technologies inspection tools

05/29/2012 

Rudolph Technologies Inc. will deliver 14 NSX Series 320 inspection systems to a large outsourced semiconductor assembly and test (OSAT) provider.

Process Watch: The dangerous disappearing defect

05/29/2012 

In this first installment of a series called "Process Watch,” experts from KLA-Tencor explain why a defect might be classified as “Not Found” or “SEM Non-visual (SNV),” and how a SNV count can disguise or hide real problems.

Top suppliers of semiconductor assembly and test equipment: VLSIresearch survey

05/25/2012 

THE BEST rankings from VLSIresearch identify the highest-rated suppliers of wafer processing, assembly, and test equipment. The top 2 test equipment suppliers were just fractions apart in the rankings.

MEMS Symposium Report: Chasing 1 Trillion

05/24/2012 

The 10th Annual MEMS Technology Symposium sponsored by MEPTEC (MicroElectronics Packaging and Test Engineering Council) was held May 23 at the San Jose Holiday Inn. This year’s theme was “Sensors: A Foundation for Accelerated MEMS Market Growth to $1 Trillion.”

APNT's new thermal interface materials meet power semiconductors' reqs

05/23/2012 

Applied Nanotech Holdings Inc. uncrated the THERCOBOND family of highly thermally conductive bonding and printed materials for power electronics and photonics packaging.

Indium expands electronics materials manufacturing with new facility in NY

05/23/2012 

Indium Corporation acquired a manufacturing facility in Rome, NY, to expand its production capacities of indium-, gallium-, germanium-, and tin-based materials, as well as other compounds.

Dow Electronic Materials promotes Muni to direct advanced packaging products

05/21/2012 

Bhavesh Muni took the helm as global business director for the Advanced Packaging Technologies business of Dow Electronic Materials, covering Dow's semiconductor packaging materials product portfolio and its manufacturing capabilities.

IC packaging substrates heading for $8.67B in 2012

05/18/2012 

In 2012, the global IC substrate market will reach a value of USD8.67 billion, according to Research in China




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

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