Materials and Equipment

MATERIALS AND EQUIPMENT ARTICLES



MVTS expands in California, Malaysia, and Taiwan

10/18/2011 

MVTS Technologies opened new offices in San Jose, CA; Penang, Malaysia; and Hsinchu, Taiwan to support growing demand for test, assembly, and other IC production equipment and services among semiconductor manufacturers.

Air-cooled wafer probe chuck debuts in modular format

10/17/2011 

ERS uncrated the ERS AirCool 3 wafer thermal test system with modular options and easy integration into all major wafer prober systems.

IMAPS: Markovich takes reins, Jones given Lifetime Achievement Award

10/14/2011 

At the IMAPS 44th International Symposium on Microelectronics in Long Beach, CA, Voya Markovich, well-known industry PCB and packaging expert, took over the reins as the organization

IMAPS semiconductor packaging award bestowed on Nordson Asymtek's Adamson

10/14/2011 

Steven J. Adamson, marketing specialist with Nordson ASYMTEK, received the Daniel C. Hughes, Jr., Memorial Award, for the greatest contribution to IMAPS and the microelectronics packaging industry.

SEMI honors industry leaders at SEMICON Europa

10/13/2011 

SEMI honored Dr. Tibor Pavelka (Semilab) with the European SEMI Award; Heinz Kundert (SEMI Europe) with the IC Industry Award for Excellence; and Christian Prischmann (UIbrich) with the SEMI Europe Standards Leadership Award.

Fraunhofer, EVG develop temporary wafer bonding for thicker die

10/11/2011 

EV Group (EVG) will work with Fraunhofer IZM's ASSID research center to develop temporary bonding/debonding technologies for thicker die structures, some as large as 600

CSCD probe head accurately tests high-frequency devices on small pads

10/11/2011 

Cascade Microtech Inc. debuted InfinityQuad, a multi-contact probe head capable of automatically probing aluminum (Al), copper (cu), or gold (Au) pads as small as 30 x 50

Fraunhofer IZM's packaging center installs Altatech CVD

10/11/2011 

All Silicon System Integration Dresden (ASSID) installed an Altatech 300mm CVD tool for dielectric film deposition on advanced through silicon vias (TSV), with diameters as small as 10

DuPont LTCC material suits 50GHz+ electronics

10/07/2011 

DuPont Microcircuit Materials, part of DuPont Electronics & Communications, uncrated its DuPont GreenTape 9K5 low temperature co-fired ceramic (LTCC) packaging material, offering good dielectric constant properties for higher speed, frequency, and reliability applications.

Multitest wins gravity test handler order for leaded and leadless package test

10/06/2011 

Test equipment provider Multitest installed a MT9928 XM Gravity Test Handler at a semiconductor production facility after a 1-year+ benchmarking against two major competitors.

Tamar Technology debuts TSV metrology tool WaferScan

10/04/2011 

Tamar Technology shipped its first fully automated WaferScan system to a major semiconductor fab. The system performs TSV etch depth, deep trench depth, wafer thickness, photo-resist thickness, and hole diameter metrology.

BC discovers CNT's 3 growth phases during PECVD

10/03/2011 

Boston College researchers have discovered two early-stage phases of carbon nanotube (CNT) growth during plasma enhanced chemical vapor deposition (PECVD). A disorderly tangle of tube growth ultimately turns into orderly rows of the nanoscopic tubes.

IMAPS 2011 preview

10/03/2011 

IMAPS 2011, the 44th International Symposium on Microelectronics, will take place in less than one week at the Long Beach Convention Center. Ahead of the show, here are some of the highlights for attendees.

Gartner: 2011 capex softer, 2012 messy

09/30/2011 

Semiconductor equipment spending in 2011 looks to be slightly weaker than anticipated, and is looking a lot softer in 2012 across the board, according to Gartner's new semiconductor capex forecasts.

Graphene races CNT for nanomaterial commercialization

09/28/2011 

Both graphene and carbon nanotubes (CNT) suit applications from flexible displays to silicon-replacing transistors. In a relatively short time, graphene has emerged as a low-cost, tunable material for all kinds of electronics. Will graphene overtake CNTs as the nanomaterial of future devices?

Epson inkjet semiconductor marking system prevents die damage

09/27/2011 

Seiko Epson Corporation introduced the IP-2000 inkjet semiconductor marking system to print identification data on the surface of a semiconductor package without the danger of damage from laser cutting

CSCD completes test socket biz sale, authorizes stock repurchase

09/27/2011 

Cascade Microtech (NASDAQ:CSCD) completed the sale of its test socket manufacturing business for $550,000 to R&D Interconnect Solutions. Cascade's board of directors also authorized a stock repurchase program under which up to $2,000,000 of its common stock may be repurchased.

Ziptronix low-temp direct oxide bonding scales pixels to 0.7

09/27/2011 

In a podcast interview with ElectroIQ.com, Ziptronix president & CEO, Daniel Donabedian, and company CTO, Paul Enquist, discussed both the Ziptronix wafer bonding technology and their partnership with Sony.

SWeNT clears EPA approval for MWCNT fab

09/22/2011 

An Environmental Protection Agency (EPA) consent order now permits SWeNT to manufacture and distribute multi-wall carbon nanotubes (MWCNT) for commercial applications.

Rogers names president and CEO from specialty materials industry

09/22/2011 

Rogers Corporation's (NYSE:ROG) Board of Directors elected Bruce D. Hoechner as the materials company's new president and CEO, effective October 3, 2011. Hoechner's past positions were with Rohm and Haas and Dow Chemical.




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

Sponsored By:

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