Semiconductors

SEMICONDUCTORS ARTICLES



2nm-nano-channels-promise-better-Li-ion-batteries-fuel-cells-biomed-membranes

12/16/2010 

nanochannelsResearchers with the U.S. DOE's Berkeley Lab have been able to fabricate nanochannels that are only 2nm in size, using standard semiconductor manufacturing processes. These channels function differently than their larger counterparts.

IBM-plans-nano-fab-keynote-for-Pan-Pac

12/16/2010 

Speaker Armin W. Knoll, IBM Research, will share insights on use of nanofabrication techniques to make 3D structures during the keynote address at Pan Pacific 2011, January 18-20 in Hawaii.

Advances in dielectric dipole-mitigated Schottky barrier height tuning

12/16/2010 

SEMATECH at IEDM 2010Raj Jammy, SEMATECH, explains the details behind contact resistance reduction using dielectric dipole-mitigated Schottky barrier height (SBH) tuning on a FinFET source/drain. Reduction of the SBH by 100meV from the AlOx/SiO2 dipole results in a 10Ω-µm2 reduction in specific contact resistivity and a 100Ω-µm reduction in FinFET source/drain resistance (RS/D).

Cu protrusion, keep-out zones highlight 3D talks at IEDM

12/15/2010 

Dr. Phil Garrou looks at 3D IC technology discussions at IEDM 2010, including details of TSMC's integration of 3D into its advanced CMOS foundry processes, and a close examination of 3D-induced stresses.

Flip-chip-wafer-level-packaging-see-double-digit-CAGR-says-TechSearch-International

12/15/2010 

TechSearch International’s new study, "2010 Flip Chip and WLP: Market Projections and New Developments," projects a CAGR of more than 15% for flip chip units. In unit volumes, WLPs are expected to see a 12.48% CAGR from 2009 to 2014. The report profiles drivers for the demand for gold and solder bumping, as well as WLP.

IEDM Reflections, Day 1: 2Xnm NAND, 3D integration, graphene FETs, biosensors

12/15/2010 

Techcet's Michael A. Fury reports in-depth from sessions at IEDM 2010, looking at papers on NAND flash using airgaps, a lock-and-key method for 3D integration, RF performance of graphene FETs, and FET-built DNA biosensors.

Vacuum-wafer_handling-win-brings-Crossing-Automation-into-CNT-market

12/15/2010 

Crossing Automation, Inc., automation solutions and engineering services provider, announced a design win for its ExpressConnect vacuum wafer handling system by a carbon nanotube (CNT) original equipment manufacturer (OEM).

Vacuum-wafer_handling-win-brings-Crossing-Automation-into-CNT-market

12/15/2010 

Crossing Automation, Inc., automation solutions and engineering services provider, announced a design win for its ExpressConnect vacuum wafer handling system by a carbon nanotube (CNT) original equipment manufacturer (OEM).

SEMATECH, SIA, SRC pursuing 3D standards

12/14/2010 

SEMATECH, the SIA, and SRC have established a new 3D Enablement program targeting standards in inspection, metrology, microbumping, bonding, and thin wafer and die handling.

III-V-MOSFET-on-200mm-Si-fabbed-using-industry-standard-tools-SEMATECH-at-IEDM

12/14/2010 

SEMATECH IEDM researchSEMATECH's IEDM 6.2 paper demonstrated self-aligned III-V MOSFETs hetero-integrated on a 200mm substrate and fabricated with state-of-the-art industry standard silicon processing tools. Raj Jammy, SEMATECH VP, materials & emerging technologies, describes in detail the challenges that had to be overcome to complete the research.

FormFactor-FORM-makes-Board-of-Director-changes

12/14/2010 

FormFactor Inc. (NASDAQ: FORM) announced that Executive Chairman Carl Everett was elected to serve as non-executive Chairman of the Board of Directors. Current lead independent director Jim Prestridge will remain on the Board. FORM also announced the resignations of Board members Homa Bahrami, Chenming Hu and Harvey Wagner.

Which-transistor-path-FinFET-tri-gate-FDSOI-Ge/III-V-bulk-CMOS

12/14/2010 

podcast interviewWhich transistor structures and materials will garner the most support at 16nm and below? In this podcast interview, Dean Freeman, VP of research, Gartner, provides his perspective on the various paths: FinFETS, tri-gates, fully-depleted SOI (FDSOI), Ge/III-V, bulk CMOS, and so on.

Dopant-solutions-target-cost-effective-semiconductor-miniaturization-SRC-and-Waseda-U-at-IEDM

12/13/2010 

SRCAt IEDM, Semiconductor Research Corporation and researchers from Waseda University announced process and materials development  for precisely controlling both the amount and the position of channel dopants. The researchers say this advance should help extend the manufacturability of semiconductors beyond conventional doped-channel device technologies. The result is projected to enable near atomic-scale devices and single-dopant devices.

Bruker intros AcuityXR to improve optical surface profiling <130nm

12/13/2010 

Bruker Corporation (NASDAQ: BRKR) debuted the AcuityXR optical surface profiler mode that combines patent-pending Bruker hardware and software technology to enable select ContourGT non-contact, 3D optical surface profilers to break the optical diffraction limit and deliver better lateral resolutions.

Bruker intros AcuityXR to improve optical surface profiling <130nm

12/13/2010 

Bruker Corporation (NASDAQ: BRKR) debuted the AcuityXR optical surface profiler mode that combines patent-pending Bruker hardware and software technology to enable select ContourGT non-contact, 3D optical surface profilers to break the optical diffraction limit and deliver better lateral resolutions.

DIOD releases first product in thermally enhanced PowerDI5060 package

12/10/2010 

Diodes Incorporated (Nasdaq: DIOD) released its first device in its unique PowerDI5060 package, the DMP3010LPS 30V rated p-channel enhancement mode MOSFET.

Power outage at Toshiba NAND plant, analysts weigh impact

12/09/2010 

A power outage at a Japanese power plant has put a big dent in Toshiba's NAND flash output, according to multiple reports, though industry watchers are mixed as to the ultimate market impact, and who might take advantage with key NAND consumer Apple.

IEDM keynotes: Si's future, power's potential, bioelectronics breakthroughs

12/09/2010 

Techcet's Michael A. Fury reviews the themes of keynote talks at this week's IEDM conference: challenges and opportunities for future silicon technology (particularly memory), energy efficiency enabled by power electronics, and the crossover of electronics and biotech.

Ultrathin chip fab process ready to ramp: IEDM presentation

12/08/2010 

ieee iedm chipfilm techJoachim Burghartz, IMS CHIPS, presented an improved version of the group's Chipfilm technology introduced at IEDM 4 years ago. The researchers now have a manufacturable process technology.

IEDM-Panasonic-GaN-power-transistor-on-Si-uses-blocking-voltage-boosting-structure

12/08/2010 

Panasonic developed a new technique to increase the blocking voltage of gallium-nitride-based power switching transistor on silicon substrates. The blocking voltage of the Si substrate can be added to that of the GaN transistor by the new structure, which will enable the blocking voltage over 3000V.




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

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