Issue



Table of Contents

Solid State Technology

Year 2004
Issue 9

DEPARTMENTS

Editorial


If China's dicey, why not

It seems like all the semiconductor industry can think about these days is China.


World News


World News


Tech News


Technology News


Feol


A need for reassessing risk management in reticle handling

For many years, the International Technology Roadmap for Semiconductors (ITRS) has provided guidance to the semiconductor industry about technical problems facing future technology nodes that are defined according to circuit feature dimensions


Interconnect


Yield improvement by defect reduction in metal and via module cleans

In wafer cleaning, a series of tradeoffs always exists — balancing chemical cost, process throughput, and removal efficiency vs. particle redeposition, wafer surface alteration, and potential etching of the exposed thin films.


Tap


ECTC: Focus on integration

One focus at this year's Electronic Components and Technology Conference (ECTC) was highly integrated components and structures, with leading researchers taking this beyond the integrated passives that are becoming more common.


Product News


Product News


Perspectives


The industry goes back to school

It's no secret that school children in the US are not embracing careers in science, math, or engineering.


ATTENDEES-CHOICE-AWARDS

Attendees Choose Best In


Attendees choose 'best-in-show' products

Solid State Technology invited Semicon West attendees to vote on the best products they saw at the trade show, which took place from July 12–14 at San Francisco's Moscone Convention Center and July 14–16 at the San Jose Convention Center.


FEATURES

Advanced Process Control


Making the move to fab-wide APC

Major efforts are underway to move semiconductor manufacturing to fab-wide solutions for advanced process control after initial deployment, which was primarily aimed at greater control over single process steps and certain tool sets.


Contamination Control


Using re-association kinetics to identify impurities in p-type silicon

A new approach to in-line monitoring of impurities that pair with boron in p-type silicon is based on recombination lifetime measurements performed by a commercially available surface-charge profiler tool.


Photomasks


Model-based RET using interference maps, algorithms for random contacts at 65nm

Wafer-exposure imaging conditions and interference maps are employed by a novel model-based approach for optimum placement of resolution enhancement features on subwavelength photomasks.


Mems


Hybrid silicon-on-insulator micromachining for critical MEMS components

Researchers have developed a new fabrication process using SOI wafers as the starting substrate in surface micromachining.


DATA-STORAGE-SUPPLEMENT

Editorial


Thanks for the memories...

Integrated circuit technology is sometimes considered the greatest triumph of industrial technology, spawning an electronics revolution.


Features


Using an atom probe microscope to characterize read heads

The accurate characterization and control of buried interfaces is increasingly important to manufacturers of devices at the nanoscale.


Features


Structure and performance of TGMR heads for next-generation HDDs

This article will provide a general view and the current status of the new tunneling magnetoresistive technology to achieve recording performance suitable for next-generation hard disk-drive (HDD) products.


Features


Processing considerations for CMP on thin-film head wafers

As critical dimensions (CDs) in thin-film magnetic read/write heads have become smaller, chemical mechanical planarization (CMP) processes have become more critical to overall manufacturing-process performance.


Features


Hard disk-drive technology revolutionizes processing

This article reviews trends in magnetic hard disk drive (HDD) technology and discusses underlying magnetoresistive phenomena, magnetic media materials issues, and processes for fabricating leading-edge write and read heads for state-of-the-art HDDs.


Features


New memory materials will enable future 'untethered' electronics

Growing uneasiness over the ability to continue shrinking existing CMOS memory cells and the push toward portable electronics are helping to foster R&D on new memory technologies.