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(January 6, 2011) — nanoLambda Inc., an advanced nano sensor startup, announced at the Consumer Electronics Show (CES 2011) in Las Vegas that its spectrumsensor sample is now available to potential customers and development partners for alpha test, with more broad availability expected in H2 2011.

The spectrumsensor, the world’s smallest spectrometer-on-a-chip, can be used for bio-chemical detection and wearable health monitoring, as well as accurate color and light measurement of consumer electronics devices. Examples include, but are not limited to, camera, TV or LED lightings to enable accurate and consistent colors across devices and applications.

"As a very powerful non-invasive material analysis tool, the optical spectroscopy technology has been widely used in a variety of scientific or industrial applications. But the bulky size and expensive cost of the equipment, spectrometer, have prohibited its use in consumer applications," said Bill Choi, CEO of the company. "Now, nanoLambda’s mantis-i nanotechnology allows the spectrometer to become an embedded component, in an ultra-compact configuration (smaller than 5 x 5 x 2mm) at a very low cost, affordable for personal everyday applications."

Choi added, "We learned from the mantis shrimp, which has arguably the most complicated visual system of any animal on Earth. This little guy has 12 color channels ranging from ultra-violet to infra-red, and can even see both linear and circular polarized light, which is remarkable. Humans only have 3 color channels. Using nanotechnology and the brain power of intelligent software, we are trying to catch up with this little guy’s vision capabilities."

The monolithically integrated spectrumsensor chip is exhibited at the CES 2011 in Las Vegas with demonstrations of accurate color measurement during the show as its first target application (Booth #35440).

nanoLambda Inc. develops intelligent, nano-optic devices, using the fundamental plasmonic properties of nanostructured materials into application-ready systems to create disruptive consumer electronics products and applications in sensing, lighting, and displays.

Also read: Water on the moon? NASA MEMS-based Phazir spectrometer chat with Steve Senturia

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(January 5, 2010 – PRNewswire) — Hillcrest Labs, a leader in motion-control technology and interactive television applications, announced a low-cost, embedded motion-control system for TV manufacturers. The new turnkey solution is designed to support new motion pointing and gesture-enabled user interfaces for navigating the Web, Internet-based applications, and games on televisions.

It will be showcased at the International Consumer Electronics Show (CES), January 6-10, 2011, in Las Vegas, NV, in the Broadcom Meeting Room, Hillcrest Labs suite at the Renaissance Hotel, and the Universal Electronics (UEI) booth on the CES show floor.

Hillcrest’s patented Freespace MotionEngine is now integrated with Broadcom’s new BCM35230 digital TV system-on-a-chip (SoC) and Broadcom’s new BCM20730 single-chip Bluetooth solution, enabling a turn-key, cost-effective, and fully-featured motion control solution for connected televisions.

In addition at CES, Universal Electronics, manufacturer of TV remotes, will showcase a new Freespace and Bluetooth-enabled TV remote control, utilizing a single-chip, digital-output, 3-axis MEMS gyroscope from InvenSense, that is compatible with the new system from Broadcom and Hillcrest. The demonstrations will include a TV user interface optimized for motion pointing, which includes Hillcrest’s HoMEcast video application and a Webkit browser engine.

"As the demand for Internet-based content on TV continues to rise, manufacturers are seeking differentiated, turn-key, and economical solutions that enable immersive and intuitive user experiences for consumers," said Chad Lucien, senior vice president of sales and marketing for Hillcrest Labs.  "We are proud to have collaborated with Broadcom and the market leaders in remote controls and MEMS devices to create a turnkey solution that enables TV manufactures to quickly add Freespace motion control, pointing applications, and Bluetooth to connected televisions."

"Broadcom is at the forefront of producing very low power chipsets that will enable a growing portfolio of innovative remote control devices for Internet-connected TVs and home entertainment devices," said Craig Ochikubo, Vice President and General Manager of Broadcom’s Wireless Personal Area Networking line of business. "We are very pleased to have worked with Hillcrest Labs to incorporate their pioneering Freespace technology into our new class of Bluetooth and digital TV chipsets."

Unlike alternative motion control technologies, both the new chipset and compatible TV remotes use fully-integrated motion sensors that do not require additional external cameras or lightbars in order to control the onscreen viewing experience. In addition, the low-cost Bluetooth-based solution does not require line-of-site, which enables consumers to control their TVs without the need to aim at the TV.  The new system is compatible with a variety of smart TV platforms including Linux, Android or Google TV-based solutions.

Broadcom is a leader in applying Bluetooth wireless technologies to an increasingly diverse range of consumer electronics and media devices. Additional information about Broadcom is available at www.broadcom.com. Additional details about Freespace or Hillcrest Labs are available at www.hillcrestlabs.com.

(January 5, 2011) — InvenSense Inc., provider of MotionProcessors for consumer electronics, announced that LG Electronics (LG) has selected the IXZ-500 dual-axis MEMS gyroscope for the Magic Motion Remote Control within their ultra-slim INFINIA line of LED-backlight LCD 3D TVs.

The LG Magic Motion Remote Control will be showcased in the InvenSense Meeting room #MP25370 in South Hall 2 at the 2011 International Consumer Electronics Show in Las Vegas, Nevada from January 6th through the 9th. The Magic Motion remote control integrates a MEMS gyroscope and an innovative graphical user interface allowing for simple and intuitive hand movements to control motion-based navigation.
 
As the number of program viewing options proliferates and Internet TV access becomes more ubiquitous, in-air pointing, motion-based remote controls will become an increasingly required functionality for all connected TVs, according to the company. Using simple hand motions to control an on-screen cursor, the Magic Motion Remote Control enables fast intuitive navigation of Internet-based applications, television menus, embedded games, and more using LG’s Netcast Entertainment Access.

InvenSense provides MotionProcessors for the consumer electronics market, with proven technology and cumulative shipments of over 100 million units to leading customers worldwide. More information can be found at http://www.invensense.com.

(January 4, 2011) — LumaSense Technologies Inc. (LumaSense), a global provider of temperature and gas sensing solutions, acquired Buellton, CA-based InfraredVision Technology Corp. (ITC) from L-3 Communications. Financial terms of the acquisition were not disclosed.

ITC produces vanadium oxide (VOx) microbolometer detectors, which are used in thermal imaging systems such as infrared cameras. The acquisition gives LumaSense additional capabilities to build complete thermal-imaging products that can be used to improve efficiency, quality and safety in various applications in the energy, emissions and industrial markets globally. The ITC acquisition will allow LumaSense to expand its offerings into areas such as public safety with specialized applications including security, traffic control and firefighting.

By vertically integrating, LumaSense will be able to offer higher precision and repeatability in thermal imaging equipment, controlling all aspects of the system.  LumaSense will retain all of ITC’s employees, who will remain located at the company’s Buellton facilities. 

LumaSense’s technology portfolio includes sensors and cameras that monitor temperature and gas emissions globally in markets as diverse as energy, industrial, and clean technology. The company acquired Mikron Infrared in 2007. For more information, please visit www.LumaSenseInc.com.

(January 4, 2011) — University of Michigan-Dearborn mechanical engineering Prof. Pravansu Mohanty’s start-up company, CSquared Innovations, won a $25,000 Next Gen Manufacturing Award. The company uses nano-structured films and materials for diverse applications.

CSquared, a start-up venture that Mohanty founded in 2010 with his three-person team, is deploying laser-assisted atmospheric plasma deposition technology which offers a high-speed, cost-effective and highly scalable platform approach to the synthesis of nanostructural materials and films for large-area lithium-ion battery electrodes, photovoltaic materials, and industrial coatings.

The company was among 50 semi-finalists in the Accelerate Michigan Innovation Competition, one of the nation’s largest business plan competitions that awarded more than $1 million in cash prizes and attracted 600 entries.

The Accelerate Michigan Innovation Competition targets business startups with the potential to generate an immediate impact on Michigan’s economy. The awards were given by the Business Accelerator Network for Southeast Michigan in partnership with the New Economy Initiative for Southeast Michigan, Business Leaders for Michigan and the University Research Corridor during the inaugural Accelerate Michigan Innovation Competition at the University of Michigan’s North Campus Research Complex in Ann Arbor, MI.

In Fall 2010, Mohanty was invited to display the CSquared technology at U-M’s 10th annual "Celebrate Invention" event, which was held Sept. 29 at the Michigan League on the Ann Arbor campus. He was one of eight researchers selected to feature their discoveries at special kiosks during that event.

For more information, contact Beth Marmarelli, Assistant Director of Communications, 313/593-5542

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(January 3, 2011) — In converging and integrating technologies, smart systems make possible to predict, decide and interact with the environment. With the launch of the COWIN initiative, the European Research community has engaged in a new step towards value creation in miniaturized smart systems.
 

Click to Enlarge
Figure. Cell-cell interactions arrays, source : Mindseeds Laboratories

The growth of miniaturized smart systems market is an attractive opportunity to positively impact the European economy and industry. In 2008, the global market was evaluated at about $50B and it is expected to grow to $200B in 2020 (source: Yole Développement). Smartphones’ success story is just a beginning; more will come. If largest growth is expected in consumer and diagnostic applications, miniaturized smart systems find applications in a broader range of key strategic sectors that are healthcare, energy and environment, safety and security, logistics, transportation, ICT, and manufacturing. Smart systems have the ability to solve key societal issues including reducing energy consumption, developing solutions for active and healthy ageing, improving diseases’ diagnostic and treatment.

Francisco Ibanez, deputy head of unit, Micro and Nanosystems ICT programme at the European Commission, explains "the European industry is a world leader in miniaturized smart systems. Europe benefits of state-of-the-art research work supported by the European Commission in the course of the 6th and 7th R&D Framework Programmes. COWIN is a key support action to optimize value creation from European collaborative research results and to generate business opportunities."

COWIN is supporting innovation stakeholders — industrial, academic and investors — to extract the best of the European collaborative research in:

  • identifying attractive and advanced technologies fitting with their needs and expectations
  • generating added value projects by reusing advanced technologies already developed
  • supporting the creation of start-up companies
  • supporting investment in companies, key technologies and IP.

COWIN is already identified as a key tool for industrial companies willing to capture innovation in smart systems. As states Jean Luc Mate, GM at Continental Automotive: "COWIN can be a new radar for industry leaders to detect innovation from their outside world" but he also adds, as president of the EUREKA cluster EURIPIDES, “I’ve been expecting a new seamless on-emand information process to plug FP R&D results into our SMART SYSTEM industry based EURIPIDES cluster. We decide to partner on this support action to validate an easy to implement cooperation scheme. Our clear goal with COWIN is to explore new opportunities for generating new EURIPIDES projects on innovation from European collaborative results."

If Europe’s industry is world-leading in smart systems, most of venture capital’s backed start-up companies are still located in North America. They represent about 70% of global VC’s backed companies in smart systems (source: Yole Finance).  In facilitating interaction between public and private investment in Europe, COWIN will also contribute to the innovation take-up. According to Mr. Geoffroy Dubus, Partner Venture Capital at Gimv, a major European Venture Capital provider for high-tech companies, “Miniaturized smart systems are part of our investment targets.  COWIN will contribute to our screening process of added-value technologies and spin-off from world class European research centres. We are quite enthusiastic about this new initiative. COWIN has our full support."

Matchmakers between technology providers, users and investors to turn R&D into commercial offers, COWIN partners benefit from their experience and track record in innovation commercialization. COWIN’s team is composed of Yole Développement and Yole Finance (France), coordinator of the project, VDI/VDE-IT (Germany), Zabala Innovation Consulting (Spain), Euripides – the Eureka Cluster in smart systems (France) and Tartu Biotechnology Park (Estonia).

To make this initiative a success, COWIN partners are combining their technical and market expertise to make emerge business opportunities. They share their unique innovation network composed of all stakeholders in smart systems including public and private investors, Eureka community and network, regulatory bodies, end-users, industrial and academic communities. COWIN is also supported by large organizations including EPoSS, the European Technology Platform on Smart System Integration.

Géraldine Andrieux Gustin, COWIN’s coordinator, explains: "COWIN is operational and pragmatic. We are working hand in hand with research projects partners. We are providing individual support to leverage the value of their work and to reach maturity for further investment. We also give access to COWIN innovation network to identify best of best partners. We concentrate our efforts to reach concrete results in bridging the gap to market. Our objective is that with our support new products based on European R&D research become available on the market."

COWIN is a support action launched under the 7th framework Program for 3 years to strengthen the European competitiveness in miniaturized smart systems. This initiative is dedicated to the commercial exploitation of advanced technologies developed in the framework of European collaborative research projects. COWIN’s mission is to facilitate take-up of the advanced technologies worthy of investments, in order to capture innovation, win new markets and make a profit. For more information about COWIN, please contact Géraldine Andrieux Gustin, COWIN coordinator and Yole Finance partner, at [email protected]; +33 675 800 829.

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(January 3, 2011) — Driven by the rapid recovery in automotive production and inventory rebuilding among sensor component suppliers, the market for automotive microelectromechanical system (MEMS) sensors will expand to record size in 2010, according to the market research firm iSuppli, now part of IHS Inc. (NYSE: IHS).

Marking a new high point for the industry, shipments of automotive MEMS sensors will reach 662.3 million units in 2010, up a robust 32.1 percent from 501.2 million units in 2009. The projected year-end levels — including the replenishment of inventory that was depleted during the recession of 2009 — will exceed even the pre-crisis high point in 2007 of 640 million sensors, iSuppli research shows.

Click to Enlarge

The recovery in automotive MEMS shipments represents a turnaround from the depressed levels of 2009 when shipments cratered and reached a nadir, and the years ahead will provide additional room for expansion.

Nonetheless, growth will slow in 2011, with shipments anticipated to climb just 7.3 percent as the market normalizes following the exuberance in 2010. Production then will pick up again in 2012, and growth rates will end up north of 13 percent by 2014, as shown in the attached figure.

Big shapers, new applications

"One significant engine of automotive MEMS growth is the use of sensors in passenger cars supporting mandated safety technologies such as electronic stability control (ESC) and tire pressure monitoring systems (TPMS)," said Richard Dixon, senior analyst for MEMS and sensors at iSuppli. “The United States and Europe have led the adoption of legislation on such safety systems—and other countries like Australia and Canada have quickly followed suit. However, similar mandates are now being adopted in South Korea and are expected in Japan, accelerating overall adoption rates worldwide.”

The extra opportunity from both ESC and TPMS for automotive MEMS suppliers to Japan and Korea will correspond to additional revenue of some $120 million in those regions alone for the next five years, Dixon added.

China also will account for a large portion of the automotive MEMS action. Compared to U.S. or European vehicles, the electronics content of low- and mid-range vehicles in China is about 50 percent less. However, sensor penetration will steadily increase—first in powertrain applications in order to reduce carbon emissions that choke Chinese cities and afterward as safety sensors for additional airbags and ESC systems.

Among the new applications providing suppliers greater production opportunities for automotive MEMS sensors, the most prominent include usage of gas sensors to control air quality in the cabin; infrared thermopiles to monitor temperature; microbolometers to aid night-vision systems; and MEMS oscillators to boost rear-view cameras.

Sensor fusion will be a contentious issue, however. While the sales of accelerometers used to measure inclination as part of an electronic parking brake (EPB) will accelerate in Europe in the next five years, EPB prospects are also dampened by ESC systems, which already contain the two-axis accelerometers capable of delivering the required inclination signal for parking brakes.

Sensor fusion uses existing sensor signals and adds application algorithms to augment existing systems, such as ESC, with features like hill-start-assist functionality, for instance. This is a bane for sensor suppliers, which must rely on opportunities that involve standalone systems to provide additional sensors. On the other hand, inclination-based car alarms do not access accelerometers in ESC systems and require standalone accelerometers.

Other applications that will propagate the use of sensors include passenger protection systems that detect impacts by means of either accelerometers or pressure sensors located in the front bumper, as well as stop-start systems that need pressure — and other non-MEMS based measurements to supply critical data when a vehicle’s engine is turned off at a junction.

Inroads also being made by consumer-oriented suppliers

iSuppli also notes that some consumer-oriented MEMS sensor suppliers are making inroads into the automotive market, widening the pool of players participating in the space.

In particular, STMicroelectronics—the leading MEMS supplier for consumer and mobile applications and which so far has targeted non-safety critical automotive applications, such as car alarms and navigation—has now entered the airbag market with a high-g accelerometer. STMicroelectronics is expected to leverage its significant manufacturing economies of scale, which likely will lead to additional price pressure and new cost structures in the industry.

Learn more about the latest developments in the MEMS market with the recent MEMS brief, entitled: Automotive MEMS Market Witnessing a Record 2010 at http://www.isuppli.com/MEMS-and-Sensors/Pages/Automotive-MEMS-Market-Witnessing-a-Record-2010.aspx?PRX. iSuppli provides technology value chain research and advisory services. IHS (NYSE: IHS) is a leading source of information and insight in pivotal areas that shape today’s business landscape.

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(January 3, 2011) — Driven by the rapid recovery in automotive production and inventory rebuilding among sensor component suppliers, the market for automotive microelectromechanical system (MEMS) sensors will expand to record size in 2010, according to the market research firm iSuppli, now part of IHS Inc. (NYSE: IHS).

Marking a new high point for the industry, shipments of automotive MEMS sensors will reach 662.3 million units in 2010, up a robust 32.1 percent from 501.2 million units in 2009. The projected year-end levels — including the replenishment of inventory that was depleted during the recession of 2009 — will exceed even the pre-crisis high point in 2007 of 640 million sensors, iSuppli research shows.

Click to Enlarge

The recovery in automotive MEMS shipments represents a turnaround from the depressed levels of 2009 when shipments cratered and reached a nadir, and the years ahead will provide additional room for expansion.

Nonetheless, growth will slow in 2011, with shipments anticipated to climb just 7.3 percent as the market normalizes following the exuberance in 2010. Production then will pick up again in 2012, and growth rates will end up north of 13 percent by 2014, as shown in the attached figure.

Big shapers, new applications

"One significant engine of automotive MEMS growth is the use of sensors in passenger cars supporting mandated safety technologies such as electronic stability control (ESC) and tire pressure monitoring systems (TPMS)," said Richard Dixon, senior analyst for MEMS and sensors at iSuppli. “The United States and Europe have led the adoption of legislation on such safety systems—and other countries like Australia and Canada have quickly followed suit. However, similar mandates are now being adopted in South Korea and are expected in Japan, accelerating overall adoption rates worldwide.”

The extra opportunity from both ESC and TPMS for automotive MEMS suppliers to Japan and Korea will correspond to additional revenue of some $120 million in those regions alone for the next five years, Dixon added.

China also will account for a large portion of the automotive MEMS action. Compared to U.S. or European vehicles, the electronics content of low- and mid-range vehicles in China is about 50 percent less. However, sensor penetration will steadily increase—first in powertrain applications in order to reduce carbon emissions that choke Chinese cities and afterward as safety sensors for additional airbags and ESC systems.

Among the new applications providing suppliers greater production opportunities for automotive MEMS sensors, the most prominent include usage of gas sensors to control air quality in the cabin; infrared thermopiles to monitor temperature; microbolometers to aid night-vision systems; and MEMS oscillators to boost rear-view cameras.

Sensor fusion will be a contentious issue, however. While the sales of accelerometers used to measure inclination as part of an electronic parking brake (EPB) will accelerate in Europe in the next five years, EPB prospects are also dampened by ESC systems, which already contain the two-axis accelerometers capable of delivering the required inclination signal for parking brakes.

Sensor fusion uses existing sensor signals and adds application algorithms to augment existing systems, such as ESC, with features like hill-start-assist functionality, for instance. This is a bane for sensor suppliers, which must rely on opportunities that involve standalone systems to provide additional sensors. On the other hand, inclination-based car alarms do not access accelerometers in ESC systems and require standalone accelerometers.

Other applications that will propagate the use of sensors include passenger protection systems that detect impacts by means of either accelerometers or pressure sensors located in the front bumper, as well as stop-start systems that need pressure — and other non-MEMS based measurements to supply critical data when a vehicle’s engine is turned off at a junction.

Inroads also being made by consumer-oriented suppliers

iSuppli also notes that some consumer-oriented MEMS sensor suppliers are making inroads into the automotive market, widening the pool of players participating in the space.

In particular, STMicroelectronics—the leading MEMS supplier for consumer and mobile applications and which so far has targeted non-safety critical automotive applications, such as car alarms and navigation—has now entered the airbag market with a high-g accelerometer. STMicroelectronics is expected to leverage its significant manufacturing economies of scale, which likely will lead to additional price pressure and new cost structures in the industry.

Learn more about the latest developments in the MEMS market with the recent MEMS brief, entitled: Automotive MEMS Market Witnessing a Record 2010 at http://www.isuppli.com/MEMS-and-Sensors/Pages/Automotive-MEMS-Market-Witnessing-a-Record-2010.aspx?PRX. iSuppli provides technology value chain research and advisory services. IHS (NYSE: IHS) is a leading source of information and insight in pivotal areas that shape today’s business landscape.

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Executive Overview

The opportunities that nanotechnology presents to our industry are many, and a short article cannot come close to covering the breadth implied by this title! However, following a general introductory discussion, a few selected examples will help build an understanding of basic concepts behind some of the latest nanoelectronics research efforts. Most of the examples are taken from university research on potential "beyond-CMOS" device technologies funded by an industry-government partnership. References to more detailed publications on these projects are included to serve as a "pointer to the literature" on some of today’s most significant nanodevice research.

Robert Doering, Texas Instruments, Dallas, Texas, USA

In common usage, "nanotechnology" refers to structures (i.e., devices) and materials (and processes to fabricate them) that exhibit useful properties resulting from sub-100nm features. Note, however, that a somewhat vague restriction to "qualitatively new" is also usually included. For example, 90nm (or even 30nm) gate-length MOSFETs are not considered "nanotechnology" in many circles.

This point is even better illustrated via an informal poll of materials scientists and chemists at a meeting a few years ago, which indicated substantial agreement that nylon would be called a "nanotechnology" material if it had been invented "last week" rather than in 1935! Of course, this is just one of many examples from chemical synthesis illustrating the difficulty in creating a simple definition of "nanotechnology."

The current common usage of "nanotechnology" also usually implies something revolutionary rather than evolutionary. With respect to semiconductor product manufacturing, this criterion generally encourages focus on examples that are typically a decade or more from potential implementation.

Volume manufacturing

In the relatively near term, it appears that most of the opportunities for nanotechnologies in volume manufacturing involve nanomaterials as replacements for traditional materials. Note that the distinction between "nanomaterials/particles" and "conventional materials/particles" is often characterized, not just by structure size, but also by the degree to which they are "engineered" for specific combinations of properties. 

In current research, the "hot topic" nanomaterial for potential electronic applications is graphene, the subject of the 2010 Nobel Prize in Physics. Graphene is a single atomic layer of graphite (an allotrope of carbon), in various shapes (e.g., "nanoribbons") and orientations. Graphene has amazing properties, in part, stemming from a band structure that exhibits linear, rather than the usual quadratic, dependence of energy on momentum (i.e., like a "relativistic" particle). Its potential uses include ultracapacitors [2], transparent conductive electrodes for PV (replacement for expensive indium tin oxide) [3, 4], various forms of transistors, and many more. Although cost reduction would be the major benefit of using a nanomaterial in some cases, enhancement of material properties is generally the primary objective. Another electronics-industry example of the latter is improving the electrical and thermal conductivity of bonding materials, such as in packaging applications [5].

As we move to the "device level," there are often a greater number of nano-material/structure properties that must be simultaneously optimized, and, of course, the device manufacturing is typically more sensitive to contamination. However, as for packaging, the most straight-forward device opportunities for the introduction of nanotechnology are also in the form of materials replacements or additives. A long-pursued example is the use of nanoparticles in nonvolatile memory [6]. There are many others, but the remainder of this article is devoted to highlighting a few of the potential device nanotechnologies that are currently being explored as possible alternatives to CMOS transistors in future semiconductor manufacturing.

History of nanoelectronics development

In 2003, the Semiconductor Industry Association (SIA) formed a Nanoelectronics Working Group, which recommended that industry and government partner to sponsor increased university research in two related areas: (1) novel nanodevices targeted at density, power efficiency, and speed beyond estimated ultimate limits for scaled CMOS, and (2) a novel form of nanomanufacturing that would allow the industry to dramatically depart from the increasing capital and operating cost trends that are so familiar in the traditional "deposit/pattern/etch" (a.k.a, thin-film "planar process") paradigm of the last half century.

These recommendations were presented both to the President’s Council of Advisors on Science and Technology (in 2003) [7] and to the SIA Board of Directors. In March of 2005, six of the SIA member companies, AMD, Freescale, IBM, Intel, Micron, and Texas Instruments, responded by forming the Nanoelectronics Research Initiative (NRI), a consortium activity that funds university research as a part of the Semiconductor Research Corporation (SRC). In 2010, the corporate members of NRI are AMD/Global Foundries, IBM, Intel, Micron, and Texas Instruments. NRI is also currently supported by the National Institute of Standards and Technology (NIST), the National Science Foundation (NSF), and several state and local governments.

Thus far, the NRI research has identified quite a few possible approaches to "beyond CMOS" devices, which are currently at various stages of theoretical and experimental evaluation. A first pass has also been made at estimating their performance against a consensus "ultimate CMOS," which is currently equated to what is popularly called "the 15nm technology node." Details of this initial comparison have been submitted for publication [8].

The remainder of this article provides very brief descriptions of just a few of the NRI device concepts currently under study and encourages interested readers to consult specific references for detailed accounts of the research completed to date.

Exploring new switching devices

The biggest challenge in replacing the basic field-effect transistor (FET) as a switch is that it is already extremely good and further scalable! As long as its materials properties can be improved and the manufacturing technology/cost is up to the feature-scaling task, the conventional FET theoretically approaches performance and energy efficiency close to physical limits imposed by the uncertainty principal, equilibrium thermodynamics, and electrodynamics, at least for devices based on individual charged-particle (e.g., electron) behavior.

The history of studying these limits goes back to Von Neumann and was well summarized by Meindl a decade ago [9]. This recognition has prompted much of the early NRI research to focus on information state variables that are alternative to "the amount of electrical charge on FET gates" employed by CMOS logic. It has also encouraged some study of non-equilibrium operation and "thermal-phonon engineering."

Despite the just-mentioned excellence of scaled/materials-enhanced FETs, NRI research indicates that several forms of tunnel FETs (TFETs) may use less power at a given speed. An enabler for such TFETs could be graphene-nanoribbon channels [10]. In fact, many of the currently-studied NRI switches are based on using graphene in some part of the nanostructure. Thus, it’s possible that "carbon nanoelectronics" may at least augment silicon CMOS at some point in the future. Of course, we are a long-way from volume manufacturing of integrated circuits with graphene. However, NRI process/materials research has already produced a promising breakthrough in CVD of large-area graphene layers [11], which could have many uses, including the manufacturing of TFETs and more-exotic devices, as well as the previously-mentioned transparent-electrode application.

Another graphene-based switch being studied in NRI is the Veselago device [12], which is designed to manipulate electron wave functions as if they were electromagnetic waves (i.e., analogously to optics). Such devices take advantage of the focusing properties of p-n junctions in graphene and have been estimated to have the potential for very high speed.

Note that the devices previously discussed all still use "quantity of electric charge" as the logic state variable. Of course, in hard-disk and some other memories, atomic-spin orientation has long been used to represent information. So far, commercial spin-based memories have all employed spin in the form of magnetic domain orientation.

Figure 1. Magnetic force micrograph of a one-bit full adder constructed with permalloy nanomagnets. The arrows indicate the in-plane magnetic field polarity. The individual nanomagnets in the circuit are 60x90nm, with a thickness of 30nm deposited on oxidized silicon. SOURCE: Courtesy of Edit Varga, Nanomagnet Logic Group, and Alan Seabaugh and Wolfgang Porod, NRI Midwest Institute for Nanoelectronics Discovery, University of Notre Dame.

NRI research has shown that magnetic states can also be used to perform "nanomagnet logic" (NML) [13], as demonstrated in Fig. 1. Like most of the NRI spin-based devices studied thus far, NML seems to fit best with applications requiring very low power at modest speed. NRI also conducts research on devices based on electron-spin transport [14]. In some devices, the spin-state information can be moved between logic elements without transporting any electric charge, an obvious advantage for low-power operation. A general challenge for the spin-based devices is that they do not tend to have intrinsic gain and, thus, need occasional logic-level boosts.

Exploring collective "pseudospin"

One of the most exciting approaches to alternative logic state variables is the potential exploitation of collective quantum phenomena as opposed to single-particle states. Perhaps the most exotic state variable explored thus far in the NRI program is collective "pseudospin."

Actually, several different phenomena are labeled as pseudospin in modern physics. All share the simple Pauli mathematics of two-state quantum systems originally developed for description of the "ordinary spin" (i.e., intrinsic angular momentum) of spin-1/2 particles. The form of pseudospin most studied in NRI corresponds to the discrete "which-layer?" degree of freedom for the location of an electron in a bilayer graphene system. Note that "top/bottom layer" is analogous to "up/down spin."

The really exciting aspect of this form of pseudospin is the theoretical prediction that the ground state of a suitable graphene bilayer may be an above-room-temperature Bose-Einstein condensate corresponding to a coherent superposition of excitons, each consisting of an electron on one layer and a hole on the other [15]. If this prediction is correct, such a condensate would be the first room-temperature superfluid.

A simple way of understanding why this might be possible is to recognize that the binding between electron and hole in each exciton is due to their relatively strong mutual electrostatic attraction – much stronger than the lattice-distortion attraction between the Cooper pairs of electrons in the condensate corresponding to standard superconductivity. Of course, the weakly-bound Cooper pairs "fall apart" far below room temperature.

Figure 2. Current path in a bilayer-pseudospin field-effect transistor (BiSFET) as modulated by gate control of Bose-Einstein exciton condensate formation. SOURCE: Courtesy of Seyoung Kim, Emanuel Tutuc, and Sanjay K. Banerjee, NRI Southwest Academy of Nanoelectronics, University of Texas at Austin.

One of the criteria for formation of the bilayer exciton condensate is optimum spacing (perhaps via an intervening dielectric) of the graphene layers. Other criteria are related to the quality of the graphene layers and their mutual alignment. An NRI logic device based on such a superfluid condensate of excitons is the bilayer pseudospin FET (BiSFET) [16], which controls the presence or absence of the condensate via applied gate voltages. BiSFET operation is schematically illustrated in Fig. 2.

Fostering collaboration

One of the strengths of NRI is the interdisciplinary collaboration that it fosters between electrical engineers, physicists, materials scientists, et al. The potential room-temperature Bose-Einstein condensate just discussed is of obvious interest to physicists and material scientists even as "merely" a new solid-state phenomenon – one which could lead to future Nobel Prizes! However, turning this phenomenon, if it exists at room temperature, into a logic building block, such as a BiSFET, also requires investigation at the circuit level, led by the electrical engineers, but still in need of broad collaboration.

For example, in communicating with each other, such devices may need sophisticated clocking schemes, which could dilute their power-delay-product advantage over ultimate CMOS if ordinary FET clocks were needed as part of a hybrid circuit. This is analogous to the aforementioned limitation of the electron-spin devices in needing periodic logic-level boosts from devices with gain (most likely conventional FETs). In fact, a general issue at the circuit level for many of the NRI devices is an efficient mechanism for rapidly transporting the logic state from device to device. Note that this might be accomplished via an "information token" (the form in which logic state is transported) that is distinct from the logic-state variable itself.

Figure 3. Schematic view of spin wave majority-gate logic. A bit of information is encoded into the phase of the propagating spin wave (e.g., relative phases 0 and "pi" correspond to logic states 0 and 1, respectively). The phase of the output spin wave is determined by interference as the majority of phases of the input signals. SOURCE: Courtesy of Kang L. Wang, Alex Khitun, and Ming Bao, NRI Western Institute of Nanoelectronics, University of California at Los Angeles.

One approach is to use electromagnetic waves (from RF to light) to transport electric-charge-state information from one circuit to another. However, this requires emission/detection conversion processes, which generally compromise overall power efficiency. Thus, NRI has also explored a related option in which surface plasmons rather than photons are the information tokens [17]. Surface plasmons are quasiparticles representing correlated electron-photon states, and they negotiate sharp turns more efficiently than "stand-alone" photons. Overall, the transport or "interconnect" problem is often just as large a challenge as the "switch" problem. Therefore, some of the NRI devices, such as the NML, "spinwave" [18] and Veselago devices, intrinsically integrate information transport into the basic concept. Spinwave logic is depicted in Fig. 3.

Conclusion

In summary, the NRI results to date generally offer more encouragement for surpassing the capabilities of CMOS in achieving lower-power operation (at a given speed) rather than far higher ultimate speeds [6]. At this point, the NRI program has not yet identified any single, most-promising candidate for a beyond CMOS nanotechnology. However, if we are fortunate, there may eventually be several.

References

1. M. S. Fuhrer, C. N. Lau, A. H. MacDonald, "Graphene: Materially Better Carbon," MRS Bulletin, vol. 35, pp. 289-295, April, 2010.

2. M. D. Stoller, S. Park, Y. Zhu, J. An, R. S. Ruoff , "Graphene-Based Ultracapacitors," Nano Letters, vol. 9, no. 10, pp. 3498-3502, Sept. 13, 2008.

3. M. Wilson, "Graphene Production Goes Industrial," Physics Today, vol. 63, no. 8, pp. 15-16, August, 2010.

4. S. Bae, et al., "Roll-to-roll Production of 30-inch Graphene Films for Transparent Electrodes," Nature Nanotechnology, vol. 5, pp. 574-578, June, 2010.

5. D. Wakuda,   K.-S. Kim,   K. Suganuma, "Ag Nanoparticle Paste Synthesis for Room Temperature Bonding," IEEE Trans. on Comp. and Packaging Tech., vol. 33, no. 2, pp. 437-442, June, 2010.

6. D. Tsoukalas, "From Silicon to Organic Nanoparticle Memory Devices," Philosophical Trans. of the Royal Society, A28, vol. 367, no. 1905, pp. 4169-4179, Oct., 2009.

7. R. Doering, "Nanotechnology Research Recommendations," public meeting of the President’s Council of Advisors on Science and Technology, Washington, D.C., Dec. 2, 2003.

8. K. Bernstein, R. Cavin, W. Porod, A. Seabaugh, J. Welser, "Device and Architecture Outlook for Beyond-CMOS Switches," to be published in Proc. of the IEEE, submitted in January, 2010.

9. J. D. Meindl, Q. Chen, J. A. Davis, "Limits on Silicon Nanoelectronics for Terascale Integration," Science 14, vol. 293. no. 5537, pp. 2044 – 2049, Sept., 2001.

10. Q. Zhang, T. Fang, H. Xing, A. Seabaugh, D. Jena, "Graphene Nanoribbon Tunnel Transistors," IEEE Electron Device Lett., vol. 29, pp. 1344-1346, 2008.

11. X. Li, W. Cai, E. Tutuc, S.K. Banerjee, L. Colombo, R. S. Ruoff, et al., "Large-Area Synthesis of High-Quality and Uniform Graphene Films on Copper Foils," Science 5, vol. 324. no. 5932, pp. 1312 – 1314, June, 2009.

12. V. V. Cheianov, V. Fal’ko, B. L. Altshuler, "The Focusing of Electron Flow and a Veselago Lens in Graphene p-n Junctions," Science 2, vol. 315. no. 5816, pp. 1252 – 1255, March, 2007.

13. M. Alam, G. H. Bernstein, J. Bokor, D. Carlton, X. S. Hu, S. Kurtz, et al., "Experimental Progress of and Prospects for Nanomagnet Logic (NML),"Technical Digest of the 2010 IEEE Symposia on VLSI Technology and Circuits, Honolulu, HI, June, 2010.

14. B. Behin-Aein, D. Datta, S. Salahuddin, S. Datta, "Proposal for an All-spin Logic Device with Built-in Memory," Nature Nanotechnology 5, pp. 266 – 270, Feb., 2010.

15. H. Min, R. Bistritzer, J.-J. Su, A. H. MacDonald, "Room-temperature Superfluidity in Graphene Bilayers," Phys. Review B, vol. 78, 121401, Sept., 2008.

16. D. Reddy, L. F. Register, E. Tutuc, S. K. Banerjee, "Bilayer PseudoSpin Field-Effect Transistor: Applications to Boolean Logic," IEEE Trans. on Electron Devices, vol. 57, no. 4, p. 755, April, 2010.

17. A. Hosseini, H. Nejati, Y. Massoud, "Design of a Maximally Flat Optical Low-pass Filter Using Plasmonic Nanostrip Waveguides," Optics Express, vol. 15, no. 23, 1528112, Nov., 2007.

18. A. Khitun, M. Bao, Y. Wu, J.-Y. Kim, A. Hong, A. P. Jacob, et al., "Logic Devices with Spin Wave Buses – an Approach to Scalable Magneto-Electric Circuitry," MRS Symp. Proc., vol. 1067, B01-04, 2008.

Biography

Robert Doering is a Sr. Fellow and Research Strategy Manager at Texas Instruments, P.O. Box 650311, MS 367, Dallas, Texas 75265; ph.: 972-995-2405; email: [email protected].

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Executive Overview

Each year, several billion CMOS image sensors are manufactured to meet the growing demand for cameras in electronics products, notably camera phones, laptops (web cams) and now TVs. Fabricating device packages at the wafer-level provides economic advantage over discrete approaches since the materials and process costs are shared among the good die on the wafer, which can number many thousands for small die. Wafer-level packages also have the technical advantages of smaller dimensions, shorter interconnects and more consistent part-to-part performance. This article discusses the use of wafer-level packages, which satisfy the requirements.

Giles Humpston, Tessera Inc., San Jose, California, USA

Wafer-level packages for image sensors are unique on three counts. First is that the package must have an optically transparent window to permit light from the scene being imaged to reach the sensor. Second, the package has to provide environmental protection to the die in the form of stopping dust and dirt falling on the optically sensitive area. Third, image sensors can be made in two orientations, namely front-side illuminated and back-side illuminated, yet the same package is required to be compatible with both. Meeting these requirements has lead to the development of highly specialized, yet extraordinarily low cost, wafer-level packages for image sensors. It is predicted that by 2012 more than 70% of the image sensors produced annually will be housed in wafer-level packages.

Semiconductor device packaging

The traditional functions of a semiconductor device package are to protect the die from degradation by the atmosphere and fan-out the electrical interconnects to the next level. Because of the benign environment in which most modern semiconductors are used coupled with short expected life through product obsolescence, the need for the package to provide environmental protection has virtually disappeared. It is by no means uncommon to see essentially package-less chips attached to circuit boards, with just a polymer covering over the exposed bond pads. However, most semiconductor die are destined to interface to a printed circuit board (PCB) on which the pad size and pitch are fixed by standard, and hence, the package still has to provide the functions of redistribution and fan-out. For die larger than about 5mm on a side, it is also considered prudent for the package to incorporate a laterally compliant layer as part of the interconnect structure to act as a strain buffer. Because silicon has very low thermal expansivity, compared with common (PCB) materials, this layer works to confer acceptable fatigue life on the solder joints of the ball grid array that joins the package to the PCB.

Fabricating device packages at the wafer level provides economic advantage over discrete approaches since the materials and process costs are shared among the good die on the wafer. The benefit is most apparent when die are small and the wafers large so that many thousands or even tens of thousands can be processed simultaneously. Wafer-level packages also have the technical advantages of small footprint, the die and package having the same plan area; shorter interconnects, which permit faster operation/reduced power consumption; and more consistent part-to-part performance, reducing the need for test binning. Despite all of these benefits, development of wafer-level packages acceptable to industry has proved to be challenging and the majority of semiconductor devices are still housed in discrete packages.

Solid-state imagers

There are two principal types of solid-state image sensor, namely charge-coupled devices (CCD) and CMOS. CMOS imagers are able to function both optically and electronically, allowing for reduced size, lower power consumption and simplified assembly. Consequently, CMOS now dominates solid-state imager technology, except for niche applications where optical performance or imager resolution is paramount. Today, image sensor die are manufactured by many semiconductor companies. The smallest standardized area imager is the quarter common intermediate format (QCIF), with a resolution of 25,344 pixels, while the largest commercially available imager has 111 Mpixels.

Solid-state camera modules remained a relatively specialized product until 2001 when a common intermediate format (CIF) camera debuted on a mobile phone. Within eight years, the number of image sensors produced annually went from thousands to over 1 billion. It is estimated that in 2010, more than 80% of all mobile phones will have at least one camera, many having two. Other applications that use solid-state cameras include digital still cameras (DSC), camcorders, automotive driver aids, video security systems, web cams and increasingly, TVs. Together, these applications could consume an additional 1 billion camera modules per year by 2015.

The requirements of a package for a solid-state image sensor are not especially different from other semiconductor devices; the core needs remain a modicum of protection from the environment, redistribution and fan-out of the electrical interconnects, and absorption of thermal expansion mismatch. However, image sensors have one other requirement of the package, namely it must contain a transparent window to permit light to reach the optically active area of the die. The package must therefore contain a glass window − optically "transparent" polymers attenuate too much of the blue spectrum to be useful.

Early solid state imagers were housed in ceramic packages that were closed by a quartz cover slip. This solution, while perfectly functional, is wholly inadequate for high-volume manufacture and applications where the product cost and size are critical. Particular effort was therefore devoted to developing wafer-level packages for CMOS image sensors. This endeavor proved successful and it is predicted that by 2012, more than 70% of the image sensors produced annually will be housed in wafer-level packages.

Wafer-level image sensor package

A wafer-level package for an image sensor is relatively simple in concept (Fig. 1). A glass wafer is bonded to the front face of the die. Pathways are then formed to connect the die bond pads to a ball grid array interface on the underside of the package. Dicing frees individually packaged die. In reality, the structure and processes are considerably more complex.

Figure 1. Sequence of steps to manufacture a wafer level package for an image sensor. (Source: Tessera)

The first nuance is the glass wafer itself, which must be expansion-matched to silicon, extremely flat, thin, and free of even microscopic defects since it resides very close to the focal plane of the camera. It must also be available in conformance with SEMI standards. Few companies are able to make glass to the required specifications.

The second detail is that the glass wafer cannot be bonded to the surface of the silicon wafer. This is because the optically active area of the imager is covered with an array of microscopic lenses, one per pixel and typically 1-2µm high. These micro lenses are very fragile and cannot be cleaned. Any particle of dirt that lands on the micro lens array will stick, due to electrostatic attraction, blocking the incident light and causing a black spot in the image. The solution adopted is to form a picture frame around the micro lens array so that the glass wafer forms an optically transparent cover over the critical area. By attaching the glass wafer as the very first step in the packaging process, micro lenses are protected in their sealed cavity and any contamination that lands on the exterior surface of the glass can be easily removed.

While the glass cover provides protection to the micro lenses, it prohibits access to the die bond pads, which are rendered inaccessible beneath it. To contact the bond pads, some form of through-silicon via (TSV) must be employed. Despite being technically possible for over 30 years, TSVs have never been adopted in high-volume manufacturing. There are many contributory reasons for this, but they all adversely impact either cost, or reliability.

Figure 2. 300mm wafer and inset, single imager die housed in a wafer-scale package that uses a via-through-pad interconnect to join the die bond pads to the package lands and from there to the ball grid array interface. The interconnect is based on polymer technology with a single redistribution layer for the wiring trace. (Source: Tessera)

In contrast to most semiconductor die, image sensors have very low I/O counts for the die area. The die bond pads therefore tend to be large and widely spaced to aid process yield. By compromising on the complexity of the I/O redistribution carried by the package, it is possible to fabricate through-silicon vias based on polymer technology with a single metal layer for the wiring trace. This approach helps keep cost low and published reliability data show the package is suitable not just for portable electronics products, but able to surpass the far more exacting automotive reliability standard. A modern wafer-scale package for image sensors is shown in Fig. 2.

Sighting the TSVs over the bond pads means there are few restrictions on the bond pad size, pitch, or location. The dicing lanes can be as narrow as the silicon design rules allow, which helps to maximize the number of die per wafer and decrease unit cost. The total imager package imager thickness is approximately 500µm, making it imminently suitable for electronics products where the current fashion is for extreme thinness.

Back-illuminated image sensors

The vast majority of image sensors are front-side illuminated. That is, the light from the scene to be imaged falls on the processed face of the semiconductor, which is also the face on which the die bond pads are sited. Image sensors also come in another flavor, namely back-side illuminated, where the die is mounted inverted and the light falls on the unprocessed face of the semiconductor. This configuration yields superior performance in terms of quantum efficiency and reduced optical cross-talk, together with a reduction in the size of the corresponding camera module (Figs. 3a,b). The principal drawback of back-illuminated image sensors is higher manufacturing cost because additional and more complex processing is required. Hitherto, back-side illuminated image sensors tended to be reserved for scientific and aerospace applications.

Figure 3a. Schematic cross-section through a front-illuminated CMOS image sensor. For reasons based on physics the photo-detectors are buried 10-20µm deep in the silicon. The wiring trace that connects to each pixel is built on the surface of the wafer and is routed to minimize pixel obscuration. Nevertheless, the resulting aperture influences the maximum angle of captured incident light and also gives rise to a potential cross-talk mechanism. (Source: Tessera)

Recently, several companies have achieved breakthroughs in semiconductor processing that make back-illuminated image sensors possible for higher resolution imagers on mobile platforms where the attributes of high pixel count, good light sensitivity, and low camera module height are prized. However, the OEMs that integrate image sensors into their products do not want the problem and cost of a different style of package for each imager orientation. Back-illuminated imagers must therefore somehow be fit in wafer-level packages that have the same external structure as packages for front-illuminated imagers.

Figure 3b. Schematic cross-section through a back-illuminated CMOS image sensor. The die is fabricated in the conventional orientation, but the back silicon is then removed, exposing the photo detectors. Making the photo-detectors easily accessible to light trades manufacturing cost against performance and/or die size. (Source: Tessera)

Visible light is only able to penetrate a short distance into silicon. Therefore, in a back-illuminated imager, for photons to reach the photodiodes, the majority of the original wafer thickness must be removed. Clearly, there are basic handling and yield issues with 200mm or 300mm diameter silicon wafers that have been thinned to under 20µm. Mechanical support is provided by bonding a mechanical-grade silicon wafer to the original front face of the imager wafer. Back-illuminated imagers also use micro lens arrays, so a glass wafer, with closed cavities, is bonded to the light-sensitive side (the back side) of the device wafer. Thus, the bond pads are once again rendered inaccessible for wire bonding, being buried in the center of the glass-silicon-silicon sandwich.

The solution is to use TSV technology to access the bond pads. In this instance, the silicon through which the vias pass is the mechanical support wafer. Some subtle process changes are required to fabricate reliable interconnects to the bond pads on a back-illuminated die because of their inverted orientation. The net result is that the imager package can be made externally identical and the camera module manufacturer does not need to know whether it contains a front- or back-illuminated imager.

The better light sensitivity of back-illuminated image sensors can be put to a number of uses. One of these is to make the pixels, and thus the die smaller, since light-gathering ability is a function of the pixel area. Boosting the quantum efficiency from 25% to 70% permits the pixel size to be reduced from 2.6−1.5µm per side. For a VGA imager, this permits a wafer to accommodate around three times as many die−a reduction in unit cost that goes a long way toward offsetting the higher manufacturing and packaging cost of back-illuminated imagers.

Wafer-level package cost

Information on wafer-level package cost is difficult to obtain. However, one of the leading camera phone OEMs has published a target procurement cost for camera modules of $1 per megapixel. For a VGA camera, this means that only a few tens of cents are available to purchase a silicon die, two lenses, an infra-red filter, a light baffle and a housing for the optics, then assemble, test and ship the camera. The wafer-level package is also part of the bill of materials of the camera module, which implies that, to be in contention, the package cost per die must be extraordinarily low.

Biography

Giles Humpston received his PhD and BSc from Brunel U. (UK) and is Director, Applications (Europe) at Tessera, Inc., 3025 Orchard Parkway, San Jose, California, 95134, USA; ph.: 408-321-6000; email [email protected]

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