Microprobing Inspection Microscope

Developed for university and research laboratories inspecting wafers and substrates, the NAT-31 42&#215–540&#215 microscope inspection system includes a USB 2.0 color camera with high-clarity-zoom optics and 1-&#181m or below feature resolution. When used in conjunction with the company’s probe station, the system detects defects, alignment, and probe placement.


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