Developed for university and research laboratories inspecting wafers and substrates, the NAT-31 42×–540× microscope inspection system includes a USB 2.0 color camera with high-clarity-zoom optics and 1-µm or below feature resolution. When used in conjunction with the company’s probe station, the system detects defects, alignment, and probe placement.
Would that connect well with a PCB microscope by Omek Optics?
http://omekoptics.com/focusing-on-high-trhoughinput-optical-imaging/