Test Socket for QFN Packages — Antares Advanced Test Technologies

Quatrix Kelvin QFN, the latest test socket from Antares, uses a single set of photolithographic-based contacts, with two distinct electrical connections per terminal, on an IC package. Developed for the migration of Kelvin-configuration testing of QFN packages, it suits test processes from the R&D environment to mass production down to 0.5 mm pitch.

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One thought on “Test Socket for QFN Packages — Antares Advanced Test Technologies”

Cornelius October 6, 2016 at 4:20 pm

I do not know whether it’s just me or if everyone else experiencing issues with your blog.
It appears as if some of the written text on your posts are running off the screen. Can somebody
else please comment and let me know if this is happening to them too?
This may be a issue with my internet browser because I’ve had
this happen previously. Thanks

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