Materials and Equipment

MATERIALS AND EQUIPMENT ARTICLES



BSE acquires secondary semiconductor equipment assets

04/20/2011 

Boston Semi Equipment acquired the assets of Asia Tech Corporation, launching BSE Tech LLC. BSE Tech will deliver pre-owned front end semiconductor manufacturing equipment and spare parts, technical capabilities and financial solutions from a larger facility, with added cleanroom space.

Plasmonic resonances discovered in quantum dots

04/19/2011 

Berkeley Lab researchers have shown that plasmonic properties can be achieved in the semiconductor nanocrystals known as quantum dots. These doped semiconductor quantum dots could enable light harvesting, nonlinear optics, and quantum information processing.

Yamaguchi U installs Agilent THz vector network analysis measurement system

04/18/2011 

Agilent Technologies 1.1-THz network analysis measurement solution.Agilent Technologies Inc. (NYSE:A) delivered a fully integrated 1.1-THz network analysis measurement solution to Japan's Yamaguchi University. The solution will play a critical role in enabling the university to study metamaterials at THz frequencies.

Update from Japan: TEPCO's nuclear recovery roadmap, semiconductor materials shortage concerns

04/18/2011 

Longtime semiconductor exec Takeshi Hattori continues his reporting on the aftermath of the massive Japanese earthquake and tsunami: Updates on efforts to control the nuclear crisis, efforts to shift to "summertime" schedules to manage energy usage, and evidence of shortages in key materials for semiconductor manufacturing (H2O2 and silicon).

"Green" ITO replacement suits flex displays, EMI shielding

04/15/2011 

4-point conductivity measurement of the new transparent conducting film developed by Prof. Cor Koning (left) and prof. Paul van der Schoot (right). The black pot contains a dispersion of carbon nanotubes in water, and the white pot contains the conducting latex. Photo: Bart van Overbeeke.Researchers at Eindhoven University of Technology have developed a replacement for indium tin oxide (ITO). This transparent, conducting film is produced in water, and based on electrically conducting carbon nanotubes (CNT) and plastic nanoparticles. The film currently provides a factor 100 lower conductivity than ITO, but this could rapidly change.

Nano scale gratings stabilize VCSEL polarization

04/15/2011 

Image: The result is a nanostructure -- for example, a polarization grating on a VCSEL (vertical cavity surface emitting laser). These are semiconductor lasers frequently used in optical data transmission.Electron microscopes combined with a gas-injection system were used by Empa and EPFL researchers to write nanometer-wide surface structures, "flat gratings," to improve VCSEL lasers.

Super QFN goal of EoPlex xLC lead carrier substrate

04/15/2011 

EoPlex Technologies Inc. is promoting the xLC substrate for quad flat pack no lead (QFN) semiconductor packages. The substrate enables QFNs with hundreds of leads and multiple rows at a lower cost than conventional packages.

Secondary semiconductor equipment market is complex, and growing

04/13/2011 

At 13% of the total equipment spending for semiconductor manufacturing, secondary equipment and services are gaining importance at both 300 and 200mm fabs. SEMI and Semico announce results of their Secondary Semiconductor Equipment Market Study.

Questar wedge and ball wire bonders target small lots, high variation

04/13/2011 

Questar's Q7000 series of fine-pitch, fine-wire (17-75μm), aluminum/gold (Al/Au) automatic wedge and ball bonders Questar Products International released the Q7000 series of fine-pitch, fine-wire (17-75μm), aluminum/gold (Al/Au) automatic wedge and ball bonders to better meet smaller lot size, multiple product variation, frequent set-up change styles of package production.

Semiconductor capex not slowing down in 2011, say analysts

04/11/2011 

Two analyst reports review just how prosperous 2010 was for most (but not all) semiconductor capital companies, and how 2011 is shaping up to be even better -- even with ramifications from Japan's earthquake/tsunami disaster.

Reworkable edgebond adhesive improves CBGA and BGA thermal cycle performance

04/07/2011 

After removal of underfilled BGA, underfill residues must be removed.Zymet Inc. introduced a reworkable edgebond adhesive, UA-2605, that improves thermal cycle performance of CBGAs and plastic BGAs. The adhesive can prevent pad damage during BGA rework, particularly with fine-pitch BGAs.

Carbon nanotubes green microextraction method

04/07/2011 

Iranian researchers at Mashhad's Ferdowsi University improved the quality of microextraction by incorporating carbon nanotubes. It is possible to use their method for pre-concentration and measurement of trace environmental samples without using toxic organic solvents.

Cu wire bonding joins MagnaChip Semiconductor offerings

04/05/2011 

MagnaChip Semiconductor now offers cost-competitive and state-of-the-art copper wire bonding technology, which can create a packaging cost savings of about 20% to 30%. MagnaChip worked with the major packaging companies to develop a bonding process that protects wafers under bond pads.

Graphene transistors cool off at the nano level

04/05/2011 

Image: An atomic force microscope tip scans the surface of a graphene-metal contact to measure temperature with spatial resolution of about 10nm and temperature resolution of about 250 mK.  Color represents temperature data. Alex Jerez, Beckman Institute Imaging Technology Group.University of Illinois researchers found that graphene transistors have a nanoscale thermoelectric cooling effect that can be stronger at graphene contacts than resistive heating, lowering the temperature of the transistor.

Thinfilm PARC bring printed electronics commercialization engagement forward

04/04/2011 

Thin Film Electronics ASA (Thinfilm) and PARC, a Xerox company, entered the next phase of their co-innovation engagement for printed memory devices. This next phase extends the engagement to prototyping the product for manufacturing readiness.

AFM probe monitor improves nanoscale measurement speed accuracy

04/01/2011 

Image. As an atomic force microscope's tip degrades, the change in tip size and shape affects its resonant frequency. That can be used to accurately measure, in real time, the change in the tip's shape. Credit: Jason Killgore, NISTScientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the microscopic probes used to study nanoscale structures in situ and as it's happening. NIST materials engineer Jason Killgore measures the resonant frequency of the AFM sensor tip, a natural vibration rate.

HB LED packaging materials pros and cons

04/01/2011 

LEDDaniel Duffy, research scientist in Henkel's Advanced Technology Group, notes pros and cons of epoxy and silicone encapsulants for high-brightness LED (HB-LED) manufacturing, and what HB-LED manufacturers need from die attach materials. He also considers quantum dots.

Random yield loss during wafer cleaning

04/01/2011  The Cleaning studies of silicon wafers in DI water in both conventional wet-bath and a single-wafer cleaning tool clearly show that pumping methods have a strong influence on process performance. R. Prasanna Venkatesh, Jung-Soo Lim, Jin-Goo Part, Hanyany University, Ansan, Korea

SATS provider Sigurd chooses Multitest MT2168

03/31/2011 

Multitest MT2168 semiconductor test handlerSigurd Microelectronics Corporation (Sigurd) will be the first adopter of Multitest's MT2168 pick-and-place test handler in volume production in Taiwan. The SATS provider will use it to test various QFN packages.

Nanotech in fuel cells: Polymer dipped carbon nanotubes best platinum catalysts

03/30/2011 

Catalysts made of carbon nanotubes (CNT) dipped in a polymer solution equal the energy output and otherwise outperform platinum catalysts in fuel cells, a team of Case Western Reserve University engineers has found.




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

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