Semiconductors

SEMICONDUCTORS ARTICLES



Update from Japan: Energy policy under review, fabs recovery upset

05/10/2011 

Longtime semiconductor exec Takeshi Hattori continues his reporting on the aftermath of the massive Japanese earthquake and tsunami: Japan's reviewing its energy policy to deemphasize nuclear power, and updates on recovery efforts at Renesas, Toshiba, and Tohoku U.

Gap measurement tech from Novellus' Peter Wolters benefits from sensor, algorithm advances

05/10/2011 

Figure 3. Gap profile control on the GBIR measurement.Novellus Systems (NASDAQ: NVLS) subsidiary Peter Wolters GmbH introduced innovative gap measurement technology for double-side silicon prime wafer polishing. New high-resolution sensors and software algorithms increase control of wafer quality, as well as throughput for the AC2000-P3 system.

RFaxis' pure-CMOS on-die coexistence filter reduces package size, current consumption

05/10/2011 

RFaxis released its patent-pending On-Die Coexistence Filter technology, designed to replace "bulky and expensive" stand-alone coexistence filters for cellular, mobile, and other devices.

Nano and advanced materials R&D at Clarkson U

05/09/2011 

Clarkson researchers videosPeter Singer recently toured the Center for Advanced Materials Processing (CAMP) at Clarkson University. The following video interviews with researchers and professors cover particle transport, chemical-mechanical planarization (CMP), cleanroom technologies, and bright nano particles, among other topics.

IITC: Sneak-peek at Day 1 talks

05/09/2011 

John Iacoponi, IITC 2011 co-chair, reviews presentations and discussions on the first day of the event: three important aspects driving today's semiconductor business, and technical papers on packaging, photonics, low-k, and characterization.

Leading-edge processes, MEMS, Japan turnaround driving 2011 wafer demand

05/06/2011 

Total wafer demand will increase 11.2% to 185.3M wafers (200mm equivalent), with a number of factors driving growth above average rates, according to a recent Semico Research report.

Analysts' take: Intel's four trigate transistor triumphs

05/05/2011 

As a follow-up Intel's announcement of a new 22nm trigate transistor structure, we polled and tracked multiple industry watchers for their thoughts on the technology. Their key takeaways: Intel reasserts its manufacturing prowess, and could be setting up for plays in mobile and foundry.

IXYS engages with GMCH to fab power semiconductors

05/05/2011 

 IXYS Corporation (NASDAQ:IXYS) and General Motors Components Holdings (GMCH) entered into an agreement for the fabrication of power semiconductor wafers at the Kokomo, IN plant.

SRC attacks 3DIC reliability, design tools with new effort

05/05/2011 

Semiconductor Research Corporation is leading an effort to address key roadblocks for wide-scale adoption of the emerging 3D ICs and systems. These new initiatives will address critical reliability and design tool issues and leverage partnership between researchers from universities and the semiconductor industry.

NXP metrology labs tap Tektronix for test/measurement equip calibration and repair

05/05/2011 

NXP named Tektronix Service Solutions to provide calibration and repair services for all test and measurement instruments at NXP's production and development sites in the Netherlands.

Intel readies 22nm leap, with trigates

05/05/2011 

Intel has taken the wraps off its next chip technology, a 22nm process utilizing a new 3D trigate architecture that promises faster speeds or big power savings, which will ramp to volume manufacturing later this year.

TSVs, beyond-CMOS top IITC-MAM "must see" lists for conference chairs

05/04/2011 

Cross-sectional TEM images of metal caps on 66nm wide Cu lines for three different processes: a) process A with 5nm-thick and full coverage; b) process B with <3nm-thick and partial coverage; c) process C with 8nm-thick and partial coverage; and d) a dark-field image along with the line direction with the metal cap "A."Three chairs of IITC-MAM, opening next week in Germany, share details on papers attendees won't want to miss. Among the hot-button technologies are through silicon via (TSV) integration, RC performance, carbon interconnects, and pushing traditional technologies farther (think lithography).

CMOS image sensor IDM orders multiple Camtek AOI systems

05/03/2011 

Camtek received a follow-on order for its new Gannet automatic optical inspection (AOI) system from a leading Asian integrated device manufacturer (IDM) for the application of CMOS image sensor inspection.

28nm node: It's not for everyone

05/02/2011 

"28nm is not a node for all," says Mahesh Tirupattur, EVP at Analog Bits and moderator of the 28nm challenges panel at this week's Semico Summit. Panelists will share what it takes to integrate 28nm right the first time, with examples like Apple's iPad hardware.

Brookhaven studies FET's superconductor transition

05/02/2011 

Brookhaven National Laboratory researchers used molecular beam epitaxy to fabricate FET-like devices that yield insights into superconductivity at a relatively high temperature. Findings, such as paired electrons in the insulating state, could lead to resistance-free electronics.

Solid state drives: Backup capacitors in modern solid state drives

05/02/2011 

NAND flash block architecture.Solid state drives (SSDs) are electrically, mechanically, and software compatible with their conventional electro-mechanical counterparts -- hard disk drives (HDD) -- but instead of using rotating magnetic media to retain data, SSDs use semiconductor memory, mainly NAND flash. Radovan Faltus, AVX, considers write speed improvements when cache memory is used (in particular synchronous dynamic RAM), focusing specifically on the problematic issue of cache memory power backup.

BEOL technology at 20nm half-pitch

05/01/2011  New approaches to patterning, low-k and metallization are reviewed for 20nm hp interconnects. Gerald Beyer, Zsolt Tokei, imec, Leuven, Belgium

Pioneering new devices and materials for future ICs

05/01/2011  It is expected that from the 15nm node on, the industry will need to adopt new transister architectures; among the contenders: FinFETs and TunnelFETs. Thomas Hoffmann, imec, Leuven, Belguim

Nano-porous dielectrics and copper barriers for 28nm and below

05/01/2011  Copper barrier solutions exist that ensure electrical and reliability performance even as device scaling continues. Harry Whitesell, Eric Hollar, Kang Sub Yim, Li-Qun Xia, Thamos Nowak, Applied Materials, Santa Clara, CA USA

RDL: an integral part of today's advanced packaging technologies

05/01/2011  RDL technology has been instrumental in the development of many advanced packaging technologies such as fan-in and fan-out WLP, and TSV applications. Philip Garrou, MCNC, Research Triangle Park, NC; Alan Huffman, RTI Int., Research Triangle Park, NC




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

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