Semiconductors

SEMICONDUCTORS ARTICLES



Dai Nippon, SEMATECH semiconductor lithography printing collaboration will to develop advanced processes at UAlbany NanoCollege

08/27/2010 

Under the agreement, a team of mask cleaning experts from Dai Nippon will work with experts from SEMATECH’s Mask Clean program at CNSE’s Albany NanoTech Complex to improve the cleaning yield on extreme ultraviolet (EUV) lithography patterned, non-patterned substrates and nanoimprint lithography (NIL) templates.

Semiconductor inventories: Two takes on the industry and both seem happy

08/26/2010 

The figure shows iSuppli’s forecast of semiconductor inventory value -- both in dollar terms and in DOI -- starting from the first quarter of 2008 up to the second quarter of 2010.Chip suppliers are reporting rising inventory, but the swelling stockpiles do not represent a cause for concern at present, with demand on the rise in coming months, according to iSuppli Corp. Inventory levels are now more appropriately aligned with end-market demand, which was necessary given the level of under-shipment across many end-markets since 2HCY09, adds Doug Freedman, Gleacher & Company.

SiC, MOSFET package from IXYS improves power, weight

08/26/2010 

IXYS Corporation (NASDAQ:IXYS) integrated silicon carbide (SiC) technology and super junction MOSFET technology into a single package, enabling increased power density and higher efficiency in fast switching power supplies and solar inverter applications. The MKE product line is said to allow easier mechanical layouts and reduce parasitic losses over separate discrete package designs.

AMAT Eterna FCVD goes beyond SOD with bottoms up approach to C-free gap-fill: Interview

08/25/2010 

Applied Materials (AMAT) Eterna flow CVD for semiconductor fab.Applied Materials (NASDAQ:AMAT) today released Eterna, a new flowable CVD (FCVD) technology. Ajay Bhatnagar, director, global product management in the Gap Fill Dielectric Division, explains in-depth how it differs from conventional CVD. The technology is run on AMAT's Producer Eterna FCVD system. He also explains how it is being applied to new device architectures such as DRAM vertical transistors, NAND vertical bit stacks, and FinFETs.

What's inside Applied Materials' flowable CVD tool?

08/25/2010 

Applied execs played coy about the "unique" technology behind their new Eterna FCVD tool, which targets a $400M market (and twice that in a couple of years), but analysis of what was said offers some insights into how it works.

Reticle haze control: Global update and technology roadmap

08/24/2010 

Oleg Kishkovich, Tom Kielbaso, David Halbmaier, Entegris Inc., present analysis of a method for controlling AS haze, maintaining 193nm reticles in low-humidity lithography environments in HVM fabs. Critical reticle haze control elements and limiting factors are delineated.

Anti-fuse memory cell patent granted to Sidense

08/23/2010 

Sidense, developer of logic non-volatile memory (LNVM) IP cores, announced that the USPTO granted Sidense Patent Number 7,755,162, "Anti-fuse Memory Cell." The '162 patent adds to the Company's patent portfolio covering its 1T-Fuse memory technology.

Analysts' take: AMAT 3Q10 numbers, marketshare gains and flash dreams

08/20/2010 

Analysts break down some of the more important points of Applied Materials' 3Q10 numbers and discussions. Key takeaways: A few key marketshare wins, NAND flash is about to explode, and any macro sluggishness hasn't materialized yet in chip tool demand.

Fab metrology tool for non-critical layers enables future-proofing: Podcast with KLA-Tencor

08/19/2010 

Tom Gubiotti, product marketing manager at KLA-Tencor, discusses the design decisions that drove the company’s new film metrology tool -- the Aleris 8330 -- targeted for non-critical films at 32nm and below. Among the drivers -- especially for memory manufacturers -- is the need for high-throughput, low cost-of-ownership tools that are capable of recipe sharing around the fab, so-called, “future proofing.”Tom Gubiotti, product marketing manager at KLA-Tencor, discusses the design decisions that drove the company’s new film metrology tool -- the Aleris 8330 -- targeted for non-critical films at 32nm and below. Among the drivers -- especially for memory manufacturers -- is the need for high-throughput, low cost-of-ownership tools that are capable of recipe sharing around the fab, so-called, “future proofing.”

Mask and template inspection: Production-worthy mask inspection for emerging nodes

08/18/2010 

EUV KLA-Tencor Lithography actinic mask inspection technical feature.Actinic EUV inspection preserves the production paradigm with acceptable cost-per-inspection despite higher capital costs. Its development path is clear and achievable in time to meet technical and economic requirements for 16nm-hp production in 2015. Brian Haas, Gregg Inderhees, KLA-Tencor Corp., explain key elements of mask inspection and what actinic EUV inspection provides.

MOCVD, CVD, diffusion, epi added to GF flow controller roster

08/18/2010 

GF Series Brooks InstrumentBrooks Instrument, provider of advanced flow measurement, control and level solutions, released product enhancements to the GF Series ultra-high purity mass flow controllers. Brooks has increased the range of flow rates available on the GF Series from the current 3 sccm to 30 slpm, to a new full-scale flow rate of 55 slpm. Along with a normally open valve option, this enables use in Epi, diffusion, batch CVD, and MOCVD.

OLEDs see manufacturing tech, consumer response ripen

08/17/2010 

OLED versus LCD demand. Courtesy of DisplaySearchIn a podcast interview, Paul Semenza, SVP of Analyst Services at DisplaySearch, explains how a maturing OLED manufacturing capability is contributing to the surge in interest, as is consumer response to products that use OLEDs. One challenge, however, is scaling up vapor deposition, and solutions are being developed. 

Samsung, Seagate SSD pact: It's all about timing

08/17/2010 

Samsung and Seagate's joint push into enterprise-class solid-state drives (SSD) may be a little late, but there's still a lot of opportunity especially at the next technology node, according to analysts. This article includes a new podcast interview with Samsung's director of sales for storage products from DISKCON 2010.

Veeco sells Metrology Business to Bruker Corporation

08/17/2010 

Veeco agreed to sell its Metrology business to Bruker, for $229 million in cash. The transaction has been approved by the Board of Directors of both companies and is expected to close in the fourth quarter of 2010.

Lyric Semiconductor launches probability processing for flash memories

08/17/2010 

Lyric Semiconductor Inc., a DARPA- and venture-funded MIT spin-out, launched a new technology called probability processing, which could deliver a fundamental change in processing performance and power consumption.

CAMP CMP, Day 3: CMP fangs, dual-purpose slurry injector, "true CMP" HB-LED wafer polishing; karaoke time!

08/16/2010 

Techcet's Michael A. Fury continues his observations from this year's International Symposium on CMP at Clarkson U. in New York. Highlights from Day 3: Horrifying CMP "fangs," dissolved gases in megasonics, a dual-purpose slurry injector, the usefulness of CMP levelers, CVD Co as a Cu barrier, HB-LED sapphire wafer polishing, and a CMP Broadway moment.

Modeling energy and reliability of a CNT-based WSN on an HPC setup

08/16/2010 

Rohit Pathak and Satyadhar Joshi analyzed the effect of innovations in nanotechnology on wireless sensor networks and modeled CNT-based sensor nodes from a device prospective. A WSN model was programmed in Simulink-MATLAB and a library developed. Average energy consumption for the system has been formulated and its reliability shown holistically. Changes are needed in existing sensor node structure to improve efficiency and the assimilation of CNT-based devices in a WSN. Finally, the authors comment on the challenges and factors of reliability.

Analyst: DRAM growth hinges on litho readiness, 4Xnm migration

08/13/2010 

DRAM memory "turbulence" might rear its head in 2H10 with supplies falling short of demand, because of manufacturers' problems in migration to newer processes and unable to obtain key pieces of leading-edge equipment, according to iSuppli.

CAMP CMP, Day 2: Porosity on demand, CMP whack-a-mole, end-of-line acronym soup

08/13/2010 

Techcet's Michael A. Fury offers his observations from this year's International Symposium on CMP at Clarkson U. in New York. Highlights from Day 2: Creating "porosity on demand;" a CMP Rubik's Cube vs. Whack-A-Mole; the evolution of CMP process control; and a missing manufacturing acronym.

Steve Wozniak will keynote Flash Memory Summit 2010

08/13/2010 

Steve Wozniak will deliver a keynote address at Flash Memory Summit 2010. Wozniak's keynote, "Driving Innovation with Solid-State Technologies" will explore how solid-state storage technologies are poised to change consumer's digital lives. Wozniak's will address how solid-state technologies are proliferating through the enterprise and well beyond from financial and Web services to bioinformatics to 3D special effects.




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

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