Tag Archives: Small Times Magazine

May 25, 2007– Nanopoint, Inc. has begun shipping its CT-1000 cellTRAY imaging system, designed to enable precise live cell experimentation and imaging while significantly reducing per-experiment costs.

Unlike standard well plate-based systems, cellTRAY provides for the isolation of cells into an array of micro-wells connected via fluidic channels — allowing researchers to observe individual cells throughout the experiment, automatically navigate the wells, and capture images of live cells over time. The cellTRAY is compatible with all optical microscopes and promises to benefit cell-based assays such as cell viability, apoptosis, and RNAi studies.

The cellTRAY promises to provide more capacity, require fewer cells per day, use significantly less reagent per experiment, generate less biological waste, and provide time lapse live cell imaging capabilities not found in other products on the market today. “The cellTRAY uses nanoliters of material and reagents, significantly reducing experiment costs while enabling new applications where the researcher has limited materials, such as primary cells,” says Nanopoint president Cathy Owen.

Pricing starts at $10,000.

May 24, 2007 — Ecology Coatings, a privately held developer of nanoengineered industrial coatings for manufacturing, has entered into a definitive agreement to merge with publicly held OCIS Corporation as part of an alternative public offering (APO) transaction. The closing of the merger is targeted for June 2007, and the merged company, to be named Ecology Coatings, is expected to trade on the OTC Bulletin Board.

OCIS will offer up to 31,800,000 shares of its common stock in exchange for the outstanding common stock of Ecology Coatings. Upon completion of the merger — expected in June 2007 — the shareholders of Ecology Coatings will hold approximately 95.2% of the common stock of the surviving public entity, while the current shareholders of OCIS will own approximately 4.8%.

The management of Ecology Coatings will operate the surviving public entity. Richard Stromback, Chairman of Ecology Coatings, said, “This agreement marks a significant step in the process of becoming a publicly held company.”

May 24, 2007 – In a new study released by the Project on Emerging Nanotechnologies (PEN), called EPA and Nanotechnology: Oversight for the 21st Century, former EPA assistant administrator for policy, planning and evaluation, J. Clarence (Terry) Davies, provides a roadmap for a new EPA to better handle the challenges of nanotechnology. “This new report seeks to encourage EPA, Congress, and others to create an intelligent oversight approach that empowers EPA and promotes investment and innovation in new nanotechnology products and processes,” said PEN director David Rejeski. “As both the chair and ranking minority member of the U.S. House of Representatives Committee on Science and Technology stated last year, ‘Nanotechnology is an area of research that could add billions of dollars to the U.S. economy, but that won’t happen if it is shrouded in uncertainty about its [environmental, health and safety] consequences.’ “

The report analyzes how nanotechnology can serve as a catalyst for change in EPA and existing regulatory frameworks. It identifies major areas that require transformation within the agency — including science, program integration, personnel, international activities and program evaluation — and spells out more than 25 steps that EPA, Congress, the president, the U.S. National Nanotechnology Initiative and the nanotechnology industry as a whole should take to improve the oversight of nanotechnology. Among its recommendations are:
— EPA should launch its proposed voluntary program to collect nanotechnology risk information and should begin immediately to revise the Toxic Substances Control Act (TSCA) to better deal with nanotechnology.
— EPA and industry should create a joint research institute to conduct scientific research on nanotechnology effects.
— EPA should set up and lead an interagency regulatory coordinating group for nanotechnology oversight.
— Congress should establish a temporary committee in each house to consider options for a nanotechnology oversight mechanism.
— Congress should provide an additional $50 million each year for research on the health and environmental effects of nanotechnology products and processes.
— Congress should remove constraints that limit EPA’s ability to require that companies collect and share necessary data and other information the agency needs to oversee nanotechnology.

Davies discusses the importance of public participation and dialogue throughout this process. He also examines the role of state and local governments.

According to William D. Ruckelshaus, former EPA administrator from 1970 to 1973 and again from 1983 to 1985, “For over thirty years, the EPA has dealt with the impacts of the last industrial revolution — the internal combustion engine, steam- generated electricity, and basic chemical synthesis. Today, another industrial revolution is occurring. It is being driven by nanotechnology and its convergence with information technology and biotechnology. Nanotechnology holds tremendous potential — for breakthroughs in medicine, in the production of clean water and energy, and in computers and electronics. It may be the single most important advance of this new century. But with its ability to fundamentally change the properties of matter, nanotechnology also may pose both the greatest challenge and biggest opportunity for EPA in its history. EPA needs to seriously consider the constructive and thoughtful changes that Davies puts forward in his report.”

EPA and Nanotechnology: Oversight for the 21st Century was commissioned by the Project on Emerging Nanotechnologies, a partnership between the Woodrow Wilson International Center for Scholars and The Pew Charitable Trusts.

May 24, 2007 – Northern Louisiana’s The News Star reports that Louisiana Tech University has granted its first degree in nanosystems engineering to 23-year-old Joshua Michael Brown, who simultaneously earned an electrical engineering degree.

May 24, 2007 — VeruTEK Technologies, Inc. has completed its acquisition of publicly traded Streamscape Minerals, Inc., which will operate under the name VeruTEK, Inc. and will trade on the Over-the-Counter Bulletin Board under its new ticker symbol VTKT.OB.

The company has also announced the availability of its S-ISCO and S-ESCO coelution technologies designed to remedy environmental contamination from petroleum, chlorinated solvents, pesticides, herbicides, PCBs, dioxin, and other toxic chemicals “in place,” eliminating the need for costly excavation.

Traditional environmental remediation solutions involve the costly removal of vast quantities of contaminated soil. Often deeper contamination is left in place and the contaminants continue to impact the community. VeruTEK’s products promises safe treatment in situ by combining natural surfactants and oxidant chemistries in a manner that provides controlled dissolution and oxidation. The company says this is the first approach that holistically treats soil, groundwater, and soil gas contamination.

The products enable treatment to remove contaminants from soils, groundwater and soil vapor, even beneath existing houses and buildings. S-ISCO (surfactant-enhanced in-situ chemical oxidation) is a below ground coelute oxidant-cosolvent/surfactant mixture designed to destroy subsurface non-aqueous phase liquids (NAPLs).

S-ESCO (surfactant-enhanced ex-situ chemical oxidation) is an above-ground solution that combines in-situ soil mixing with ex-situ soil treatment and overcomes the inherent costs and limitations of excavation.

The environmental remediation market is estimated at $20 billion annually according to the EPA. Government mandated corporate reserves for remediation often exceed $100M and can exceed $1000M (SEC 2006).

May 23, 2007 — Nanophase Technologies, developer of nanomaterials and advanced nanoengineered products, has filed a Form S-3 with the Securities and Exchange Commission to register 2,000,000 shares of its common stock. Nanophase plans to sell the shares primarily to raise capital to fund acquiring and installing equipment and expanding its facilities to support anticipated increases in nanomaterials volume, and for general corporate purposes.

Joseph Cross, Nanophase’s President and CEO, noted that “production equipment needs to be in place 3-6 months before the orders can be filled and there is a lengthy procurement and build cycle for custom equipment. Recognizing this, the management team and the board of directors believes it is prudent to secure capital during 2007. We plan to use the capital generated from the sale of securities for corporate purposes, including, without limitation, funding equipment and facilities required for expected growth.”

May 23, 2007 — Hyphenated Systems , provider of hybrid microscopy solutions for three-dimensional (3D) imaging and metrology in micro- and nanotechnology, has announced the development of a combined advanced confocal/atomic force microscope (ACM/AFM) on one platform. The system is being developed jointly with atomic force microscope (AFM) provider KARMA Technology, Inc., and is geared for three-dimensional (3D) metrology applications in semiconductor manufacturing and laboratory environments.

Geared for the semiconductor industry, the system will be built to accommodate wafers up to 12-inches in diameter. It will also feature a patented probe module that is easily replaceable — eliminating the need for time-intensive probe tip changes of the AFM.
“This hybrid confocal-AFM tool is expected to be the first real, fab-friendly AFM. We are building every possible feature into it to accommodate the needs of the manufacturing environment. The probe module eliminates tool downtime due to tip changes of the AFM; a special vibration isolation platform will enable the AFM to operate with high accuracy in a manufacturing environment; and the system will combine high-speed confocal imaging of larger features with detailed atomic-resolution imaging of targeted features — without having to move the sample from one tool to another,” said Terence Lundy, company vice president and managing director.

Hyphenated Systems specializes in advanced confocal microscopes that enable 3D measurements of material structures and fluid flow with sub-micrometer resolution. The company says its patented confocal microscope technology is unique in its ability to provide extremely fast, accurate, structural characterization of materials, including steep slopes, rough surfaces, and subsurface features in transparent media, many of which are difficult or impossible to measure with alternative techniques. The combined ACM/AFM tool promises the speed and 3D imaging advantages of ACM, combined with atomic-level resolution measurement capabilities of an AFM — all on one single platform, preventing the need to move the sample.

The large-area printed photodetector array (Photo: Business Wire)

May 22, 2007 — NANOIDENT Technologies AG of Linz, Austria, says it has delivered the world’s largest printed semiconductor-based photodetector array on a flexible PET foil substrate. The array, which converts light into electrical signals, was developed with the NANOIDENT Semiconductor 2.0 platform and manufactured at the NANOIDENT Organic Fab (OFAB). NANOIDENT says its OEM partners can now realize application-specific, cost-effective, printed semiconductor-based photodetector arrays that eliminate the need for costly optical filters and can be used in a wide variety of new industrial, medical and security applications.

The NANOIDENT Semiconductor 2.0 platform serves as the core technology foundation for a range of application-specific printed semiconductor platforms and products. With its platform, NANOIDENT was able to manufacture a large-area photodetector array by depositing thin layers of conducting and semiconducting “inks” onto a plastic foil substrate using state-of-the-art printing techniques. By using printed semiconductor-based technology—which enables unique mechanical, electro-optical and structural properties—the company was able to deliver an array 18 x 12cm in size, and says it could easily produce detectors up to 50 x 50cm or larger. With large-area, ultra-thin, flexible devices that incorporate application specific spectral properties, customers are able to eliminate expensive optical filters and develop an entirely new class of application types. Sample applications for large-area photodetector arrays include industrial measurement and test, medical imaging and security screening.

“One of our industrial customers came to NANOIDENT requesting a radical new photodetector array design for a specific industrial application that could not be delivered with silicon,” said Klaus Schroeter, CEO of NANOIDENT. “Working together, we were able to deliver the industry’s first large-area array on a flexible substrate that includes specific spectral sensitivity and meets other application-specific requirements. We are excited to deliver this solution, which will transform existing test processes as well as create an entirely new application for the industrial market.”

NANOIDENT’s Semiconductor 2.0 platform is the core technology for all NANOIDENT vertical market platforms and is comprised of four core intellectual property (IP) elements, which include liquid conductive and semiconductive materials IP, design and simulation IP, production processes and quality assurance IP and functional component IP. The Semiconductor 2.0 platform enables the design and mass production of printed semiconductor-based functional components, such as photo detectors, light emitting diodes, transistors, resistors, capacitors and interconnects. With NANOIDENT’s new printed semiconductor production process, devices can also be manufactured in hours rather than weeks.

May 22, 2007 — SVTC Technologies, which recently became an independent development foundry, has introduced a full suite of commercialization services, called FastXfer services. Simultaneously the company is announcing its name change, from Silicon Valley Technology Center to SVTC Technologies.

SVTC’s FastXfer Commercialization Services include equipment stability and baseline process stability, process book creation and management, gap analysis and commonality review, test vehicles, process qualifications and yield improvement. The services promise an easier transfer to the foundry and provide much-needed assistance when interfacing with a foundry, the company says.

Designed to provide its customers with a rapid transfer to volume manufacturing, FastXfer will complement SVTC’s other services: access to a full-scale, 8-inch development foundry with a full complement of advanced CMOS equipment, plus development tools and expertise for developers serving the novel memory and transistor, MEMS/MOEMS, photovoltaic, bio-tech and hi-voltage markets.

May 22, 2007 — Agilent Technologies Inc. has introduced the Magnetic AC Mode III (MAC Mode III) controller, which it says greatly enhances the utility of Agilent’s nanotechnology measurement instruments and better enables researchers to customize their experiments. The MAC Mode III is designed for particular application in areas that require high resolution and force sensitivity, such as biology, polymers, and surface science. Built on field-proven technology, this gentle, nondestructive atomic force microscopy (AFM) technique is designed for imaging delicate samples in liquid or air.

MAC Mode III offers three user-configurable lock-in amplifiers, affording researchers versatility, higher accuracy and quicker time to results. It has a wider operating frequency range — up to 6 MHz — enabling scientists to investigate higher harmonic modes. Built-in Q control further enhances the resonance peak. Higher harmonic imaging provides contrast beyond that seen with fundamental amplitude and phase signals, allowing scientists to collect additional information about mechanical properties of the sample surface.

The Agilent MAC Mode III allows one-pass multi-channel detection for Kelvin force microscopy (KFM) and electric force microscopy (EFM). Simultaneous, high-accuracy topography and surface potential measurements are facilitated by a servo-on-height cantilever approach that is not susceptible to scanner drift. KFM/EFM offers excellent utility for measuring dielectric films, metal surfaces, piezoelectrics and conductor-insulator transitions.

MAC Mode III can be operated simultaneously with environmental control, temperature control, electrochemical control and controlled fluid exchange. Agilent’s acoustic AC mode is included with MAC Mode III.