Wafer Level Packaging

WAFER LEVEL PACKAGING ARTICLES



Semiconductor materials group prez joins JSR Corp's Officers Committee

04/28/2011 

Tokyo-based JSR Corporation named the first non-Japanese Officer to its Officers Committee. Eric R. Johnson, the current president of the company's US semiconductor materials operations, JSR Micro, has been named as an Officer.

Asian semiconductor packaging specialist orders SPTS etch, PVD and CVD technologies for TSV

04/26/2011 

SPP Process Technology Systems (SPTS) won a multi-system order for its Sigma PVD, Omega Etch and Delta CVD wafer processing systems from a leading outsourced semiconductor assembly and test (OSAT) provider in the Asia-Pacific region.

Molded flip chip imaging improved at Sonix

04/25/2011 

Sonix Inc. introduced its Molded Flip Chip Imaging (MFCI) enhancement. Sonix Inc. introduced its Molded Flip Chip Imaging (MFCI) enhancement. Sonix MFCI improves image quality and defect detection in molded flip chips and packages with polyimide (PI) layers.

Laird phase change material enables stencil applied TIM

04/23/2011 

Laird Technologies released the Tpcm 580SP Series phase change material, a high-performance, screen-printable or stencilable thermal interface material with a thermal conductivity of 4.0W/mK that provides an alternative to thermal grease.

Electronics packaging leaders gathered under cherry blossoms at ICEP

04/21/2011 

ASE FOWLPT.Onishi, Grand Joint Tech and E.J. Vardaman, TechSearch International share the highlights on low-k dielectrics, 3D packaging, copper pillar, and other exciting work presented at the International Conference on Electronics Packaging (ICEP) in Japan.

Intel honors 28 top suppliers, "achievers"

04/20/2011 

Twenty-eight companies get the nod from Intel's latest supplier awards, including four "Achievement" award winners.

Multitest ECON contactor exceeds 4.5M insertions

04/19/2011 

Multitest's ECON contactor exceeded 4.5 million insertions at an Asian test house. The contactor performance resulted in a 99% stable test yield.

STATS ChipPAC expands TSV service with mid end flow

04/19/2011 

STATS ChipPAC Ltd. (SGX-ST: STATSChP), semiconductor test and advanced packaging service provider, is expanding its 300mm through silicon via (TSV) offering with the addition of mid-end manufacturing capabilities.

Super QFN goal of EoPlex xLC lead carrier substrate

04/15/2011 

EoPlex Technologies Inc. is promoting the xLC substrate for quad flat pack no lead (QFN) semiconductor packages. The substrate enables QFNs with hundreds of leads and multiple rows at a lower cost than conventional packages.

Copper pillars appear in packages from Amkor to Unisem, says Vardaman

04/14/2011 

Following Intel's lead, many companies are moving to adopt copper pillar as the technology for their flip chip applications, as well as leadframe packages. E. Jan Vardaman, president of TechSearch International, says the move to Cu pillar is reminiscent of the transition from the evaporated bump to the plated bump.

Beyond ball shear test Microprobing chip/package stress at Stanford

04/13/2011 

IITC paper, Stanford UniversityNew work from Stanford goes beyond simple bump shear testing to allow simulation of stresses exerted on chips during semiconductor packaging. The researchers are able to explore how the stresses affect back-end structures. Alex Hsing, a PhD student in Professor Reinhold Dauskardt's Group at Stanford University, summarizes the group's approach.

Questar wedge and ball wire bonders target small lots, high variation

04/13/2011 

Questar's Q7000 series of fine-pitch, fine-wire (17-75μm), aluminum/gold (Al/Au) automatic wedge and ball bonders Questar Products International released the Q7000 series of fine-pitch, fine-wire (17-75μm), aluminum/gold (Al/Au) automatic wedge and ball bonders to better meet smaller lot size, multiple product variation, frequent set-up change styles of package production.

Applied Materials creates WLP center with Singapore Institute of Microelectronics

04/13/2011 

Applied Materials Inc. (AMAT) signed an agreement with the Institute of Microelectronics to set up a Center of Excellence in Advanced Packaging in Singapore. The Center will have a full line of wafer level packaging processing equipment and will conduct research in semiconductor hardware, process, and device structures.

Multi depth imaging system shows defect progress

04/12/2011 

Depths 15 to 18 (of 50 depths) in a ceramic chip capacitor, imaged acoustically and simultaneously with Sonoscan’s automated multi-gate system.Sonoscan has demonstrated the single-scan imaging of a sample at 50 different depths, or gates, a technique called PolyGate. It reveals how features, including defects, change from one gate to the next.

Flip chip still in growth phase, even at $16B

04/11/2011 

2010 total flip chip market value. Split by cost-of-ownership supply chain segments (substrates for LCD drivers excluded, service margin included). SOURCE: Flip Chip report, Yole Développement, April 2011.Yole reports on the flip chip market, and finds that this $16 billion industry, with diverse applications, is still growing. New flip chip technologies, such as copper pillars, and technology demands, such as fragile 28nm chips, are driving demand.

Thermal analysis system tracks temp, air velocity and pressure from multiple points

04/08/2011 

iQ-200 thermal analysis system Advanced Thermal Solutions, ATS, has released the iQ-200 thermal analysis system for precisely and simultaneously measuring the temperatures of solid materials and the surrounding air, as well as tracking air velocity and air pressure at multiple points to comprehensively profile heat sinks, components, and PCBs.

Reworkable edgebond adhesive improves CBGA and BGA thermal cycle performance

04/07/2011 

After removal of underfilled BGA, underfill residues must be removed.Zymet Inc. introduced a reworkable edgebond adhesive, UA-2605, that improves thermal cycle performance of CBGAs and plastic BGAs. The adhesive can prevent pad damage during BGA rework, particularly with fine-pitch BGAs.

Tessera focuses on semiconductor technologies beyond packaging

04/07/2011 

Tessera Technologies Inc. (Nasdaq:TSRA - News) began two corporate initiatives to expand its technologies in semiconductor microelectronics beyond packaging, and to potentially separate its Imaging & Optics business.

Keithley 2652A SourceMeter tests high power semiconductors

04/06/2011 

Keithley Instruments Model 2651A High Power System SourceMeter Keithley Instruments Inc., advanced electrical test instruments and systems provider, introduced the Model 2651A High Power System SourceMeter instrument to characterize high-power electronics, like HB-LEDs, power semiconductors, DC-DC converters, batteries, etc.

Verigy wins Freescale test equipment order

04/06/2011 

Freescale Semiconductor's Networking and Multimedia Group (NMG) placed a volume order for Verigy's V93000 scalable test platform to use in testing select QorIQ PowerPC communications microprocessors, based on Power Architecture technology.




WEBCASTS



Environment, Safety & Health

Date and time TBD

The semiconductor industry is an acknowledged global leader in promoting environmental sustainability in the design, manufacture, and use of its products, as well as the health and safety of its operations and impacts on workers in semiconductor facilities (fabs). We will examine trends and concerns related to emissions, chemical use, energy consumption and worker safety and health.

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Wafer Processing

Date and time TBD

As the industry moves to 10nm and 7nm nodes, advances in wafer processing – etch, deposition, planarization, implant, cleaning, annealing, epitaxy among others – will be required. Manufacturers are looking for new solutions for sustained strain engineering, FinFETs, FDSOI and multi-gate technologies, 3D NAND, and high mobility transistors.

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